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Paper Abstract and Keywords
Presentation 2011-10-14 16:00
Relationship between Crystal Order and Limiting Factors of Carrier Transport in Pentacene Polycrystalline film
Ryosuke Matsubara (NAIST), Toshio Nomura (Chiba Univ.), Noboru Ohashi (AIST), Masatoshi Sakai, Kazuhiro Kudo, Masakazu Nakamura (Chiba Univ.) OME2011-55 Link to ES Tech. Rep. Archives: OME2011-55
Abstract (in Japanese) (See Japanese page) 
(in English) To clarify relationship between crystallographic and electronic structures in pentacene polycrystalline films grown on SiO2, in-plane crystallite size and random strain of the films were analyzed by grazing incidence X-ray diffraction (GIXD) using synchrotron radiation source. The results indicate that the diffraction peak width is not determined by random strain but by crystallite size. The crystallite size remains constant within the range of 25-50 nm even when the size of polycrystalline domain, or crystal grain, increases more than tenfold by elevating the growth temperature. The crystallite size agrees well with characteristic periods of both HOMO-band-edge fluctuations in pentacene films, which was reported in our previous paper, and surface corrugation of the substrate. These facts strongly suggest that roughness of the SiO2 surface limits the crystallite size and the interruption of long-range order in pentacene lattice introduces the HOMO-band-edge fluctuation.
Keyword (in Japanese) (See Japanese page) 
(in English) Pentacene / AFM Potentiometry / Grazing Incidence X-ray Diffraction / Crystallite / Electronic Band Structure / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 236, OME2011-55, pp. 37-42, Oct. 2011.
Paper # OME2011-55 
Date of Issue 2011-10-07 (OME) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OME2011-55 Link to ES Tech. Rep. Archives: OME2011-55

Conference Information
Committee OME  
Conference Date 2011-10-14 - 2011-10-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. B3-2 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General Aspects and Miscellaneous Organic Devices 
Paper Information
Registration To OME 
Conference Code 2011-10-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Relationship between Crystal Order and Limiting Factors of Carrier Transport in Pentacene Polycrystalline film 
Sub Title (in English)  
Keyword(1) Pentacene  
Keyword(2) AFM Potentiometry  
Keyword(3) Grazing Incidence X-ray Diffraction  
Keyword(4) Crystallite  
Keyword(5) Electronic Band Structure  
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1st Author's Name Ryosuke Matsubara  
1st Author's Affiliation Nara Institute of Advanced Technology (NAIST)
2nd Author's Name Toshio Nomura  
2nd Author's Affiliation Chiba University (Chiba Univ.)
3rd Author's Name Noboru Ohashi  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Masatoshi Sakai  
4th Author's Affiliation Chiba University (Chiba Univ.)
5th Author's Name Kazuhiro Kudo  
5th Author's Affiliation Chiba University (Chiba Univ.)
6th Author's Name Masakazu Nakamura  
6th Author's Affiliation Chiba University (Chiba Univ.)
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Speaker
Date Time 2011-10-14 16:00:00 
Presentation Time 20 
Registration for OME 
Paper # IEICE-OME2011-55 
Volume (vol) IEICE-111 
Number (no) no.236 
Page pp.37-42 
#Pages IEICE-6 
Date of Issue IEICE-OME-2011-10-07 


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