Paper Abstract and Keywords |
Presentation |
2011-09-06 11:30
Efficient Learning for Successive TFC by Selective Assessment for defect Classification Yoshikazu Matsuo (Hokkaido Univ.), Takamichi Kobayashi (NSC), Hidenori Takauji (MIT), Shun'ichi Kaneko (Hokkaido Univ.) PRMU2011-75 IBISML2011-34 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We had proposed the method Test Feature Classifier(TFC) as a Nonparametoric Classifier and Successive TFC(sTFC). We proposed the way of selecting the data based on the active learning before the labeled to reduce the cost of it. And the experiments of successive learning shows the effectiveness of the proposed method. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Test Feature Classifier / Successive Learning / Autonomous Learning / Labeled Data / Data Selection / Boundary Data / Active Learning / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 193, PRMU2011-75, pp. 151-156, Sept. 2011. |
Paper # |
PRMU2011-75 |
Date of Issue |
2011-08-29 (PRMU, IBISML) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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PRMU2011-75 IBISML2011-34 |
Conference Information |
Committee |
PRMU IBISML IPSJ-CVIM |
Conference Date |
2011-09-05 - 2011-09-06 |
Place (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
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Paper Information |
Registration To |
PRMU |
Conference Code |
2011-09-PRMU-IBISML-CVIM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Efficient Learning for Successive TFC by Selective Assessment for defect Classification |
Sub Title (in English) |
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Keyword(1) |
Test Feature Classifier |
Keyword(2) |
Successive Learning |
Keyword(3) |
Autonomous Learning |
Keyword(4) |
Labeled Data |
Keyword(5) |
Data Selection |
Keyword(6) |
Boundary Data |
Keyword(7) |
Active Learning |
Keyword(8) |
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1st Author's Name |
Yoshikazu Matsuo |
1st Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
2nd Author's Name |
Takamichi Kobayashi |
2nd Author's Affiliation |
Nippon Steel Corporation (NSC) |
3rd Author's Name |
Hidenori Takauji |
3rd Author's Affiliation |
Muroran Institute of Technology (MIT) |
4th Author's Name |
Shun'ichi Kaneko |
4th Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
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Speaker |
Author-1 |
Date Time |
2011-09-06 11:30:00 |
Presentation Time |
30 minutes |
Registration for |
PRMU |
Paper # |
PRMU2011-75, IBISML2011-34 |
Volume (vol) |
vol.111 |
Number (no) |
no.193(PRMU), no.194(IBISML) |
Page |
pp.151-156 |
#Pages |
6 |
Date of Issue |
2011-08-29 (PRMU, IBISML) |