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Paper Abstract and Keywords
Presentation 2011-09-06 11:30
Efficient Learning for Successive TFC by Selective Assessment for defect Classification
Yoshikazu Matsuo (Hokkaido Univ.), Takamichi Kobayashi (NSC), Hidenori Takauji (MIT), Shun'ichi Kaneko (Hokkaido Univ.) PRMU2011-75 IBISML2011-34
Abstract (in Japanese) (See Japanese page) 
(in English) We had proposed the method Test Feature Classifier(TFC) as a Nonparametoric Classifier and Successive TFC(sTFC). We proposed the way of selecting the data based on the active learning before the labeled to reduce the cost of it. And the experiments of successive learning shows the effectiveness of the proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) Test Feature Classifier / Successive Learning / Autonomous Learning / Labeled Data / Data Selection / Boundary Data / Active Learning /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 193, PRMU2011-75, pp. 151-156, Sept. 2011.
Paper # PRMU2011-75 
Date of Issue 2011-08-29 (PRMU, IBISML) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PRMU2011-75 IBISML2011-34

Conference Information
Conference Date 2011-09-05 - 2011-09-06 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To PRMU 
Conference Code 2011-09-PRMU-IBISML-CVIM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Efficient Learning for Successive TFC by Selective Assessment for defect Classification 
Sub Title (in English)  
Keyword(1) Test Feature Classifier  
Keyword(2) Successive Learning  
Keyword(3) Autonomous Learning  
Keyword(4) Labeled Data  
Keyword(5) Data Selection  
Keyword(6) Boundary Data  
Keyword(7) Active Learning  
1st Author's Name Yoshikazu Matsuo  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Takamichi Kobayashi  
2nd Author's Affiliation Nippon Steel Corporation (NSC)
3rd Author's Name Hidenori Takauji  
3rd Author's Affiliation Muroran Institute of Technology (MIT)
4th Author's Name Shun'ichi Kaneko  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
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Date Time 2011-09-06 11:30:00 
Presentation Time 30 
Registration for PRMU 
Paper # IEICE-PRMU2011-75,IEICE-IBISML2011-34 
Volume (vol) IEICE-111 
Number (no) no.193(PRMU), no.194(IBISML) 
Page pp.151-156 
#Pages IEICE-6 
Date of Issue IEICE-PRMU-2011-08-29,IEICE-IBISML-2011-08-29 

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