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| Presentation | 2011-08-26 14:40 Dependable SRAM with Enhanced Read-/Write-Margins by Fine-Grained Assist Bias Control for Low-Voltage Operation Koji Nii, Makoto Yabuuchi, Hidehiro Fujiwara, Hirofumi Nakano, Kazuya Ishihara, Hiroyuki Kawai, Kazutami Arimoto (Renesas)  SDM2011-91 ICD2011-59 Link to ES Tech. Rep. Archives: SDM2011-91 ICD2011-59 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 188, ICD2011-59, pp. 103-108, Aug. 2011. | |
| Paper # | ICD2011-59 | |
| Date of Issue | 2011-08-18 (SDM, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2011-91 ICD2011-59 Link to ES Tech. Rep. Archives: SDM2011-91 ICD2011-59 |
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| Conference Information | |
| Committee | SDM ICD |
| Conference Date | 2011-08-25 - 2011-08-26 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Toyama kenminkaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Low voltage/low power techniques, novel devices, circuits, and applications |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2011-08-SDM-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dependable SRAM with Enhanced Read-/Write-Margins by Fine-Grained Assist Bias Control for Low-Voltage Operation |
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| 1st Author's Name | Koji Nii |
| 1st Author's Affiliation | Renesas Electronics (Renesas) |
| 2nd Author's Name | Makoto Yabuuchi |
| 2nd Author's Affiliation | Renesas Electronics (Renesas) |
| 3rd Author's Name | Hidehiro Fujiwara |
| 3rd Author's Affiliation | Renesas Electronics (Renesas) |
| 4th Author's Name | Hirofumi Nakano |
| 4th Author's Affiliation | Renesas Electronics (Renesas) |
| 5th Author's Name | Kazuya Ishihara |
| 5th Author's Affiliation | Renesas Electronics (Renesas) |
| 6th Author's Name | Hiroyuki Kawai |
| 6th Author's Affiliation | Renesas Electronics (Renesas) |
| 7th Author's Name | Kazutami Arimoto |
| 7th Author's Affiliation | Renesas Electronics (Renesas) |
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| Speaker | Author-1 |
| Date Time | 2011-08-26 14:40:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | SDM2011-91, ICD2011-59 |
| Volume (vol) | vol.111 |
| Number (no) | no.187(SDM), no.188(ICD) |
| Page | pp.103-108 |
| #Pages | 6 |
| Date of Issue | 2011-08-18 (SDM, ICD) |
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