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Paper Abstract and Keywords
Presentation 2011-07-22 10:25
Analysis Methods of Substrate Sensitivity in an Analog Circiut
Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) ICD2011-28 Link to ES Tech. Rep. Archives: ICD2011-28
Abstract (in Japanese) (See Japanese page) 
(in English) Substrate noise sensitivity of an analog circuit consists of the sensitivity of a device and noise propagation from the noise source to the target circuit. It is necessary for substrate noise coupling analysis to consider the physical layout of the divide and the noise propagation by the finger unit. To confirm this, we measure substrate noise sensitivity using evaluation system of analog amplifiers. An ad-hoc model in consideration of a physical layout is effective as an substrate noise coupling analysis model in an analog circuit. And we generalize this substrate model and analytical technique. The combination technique with the analysis result of the chip-level substrate propagation analysis tool is performed.
Keyword (in Japanese) (See Japanese page) 
(in English) mixedsignal VLSI / substrate crosstalk / on-chip monitor / / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 151, ICD2011-28, pp. 73-78, July 2011.
Paper # ICD2011-28 
Date of Issue 2011-07-14 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
技術研究報告に掲載された論文の著作権はIEICEに帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2011-28 Link to ES Tech. Rep. Archives: ICD2011-28

Conference Information
Committee ICD ITE-IST  
Conference Date 2011-07-21 - 2011-07-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To ICD 
Conference Code 2011-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis Methods of Substrate Sensitivity in an Analog Circiut 
Sub Title (in English)  
Keyword(1) mixedsignal VLSI  
Keyword(2) substrate crosstalk  
Keyword(3) on-chip monitor  
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1st Author's Name Satoshi Takaya  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Yoji Bando  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Toru Ohkawa  
3rd Author's Affiliation MIRAI-Selete (MIRAI-Selete)
4th Author's Name Masaaki Souda  
4th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
5th Author's Name Toshiharu Takaramoto  
5th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
6th Author's Name Toshio Yamada  
6th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
7th Author's Name Shigetaka Kumashiro  
7th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
8th Author's Name Tohru Mogami  
8th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
9th Author's Name Makoto Nagata  
9th Author's Affiliation Kobe University (Kobe Univ.)
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Speaker
Date Time 2011-07-22 10:25:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-ICD2011-28 
Volume (vol) IEICE-111 
Number (no) no.151 
Page pp.73-78 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2011-07-14 


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