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Paper Abstract and Keywords
Presentation 2011-07-15 12:20
Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance (16) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20 Link to ES Tech. Rep. Archives: EMD2011-20
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms in the vertical direction. In this paper, first, the authors improved the mechanism in some points. Second, they examined the dynamical properties of the refined mechanism and confirmed that the mechanism was able to give micro-reciprocating slides to the electrical contacts. Finally, they analyzed the characteristic degradation phenomena of real electrical contacts caused by the mechanism. Consequently the natural frequencies and damping ratio of the mechanism with connectors were estimated and it was shown that there were lower limits in the reciprocating-sliding amplitudes of the mechanism causing degradation of electrical contacts.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / hammering oscillating mechanism / natural frequency / damping ratio / frictional force  
Reference Info. IEICE Tech. Rep., vol. 111, no. 138, EMD2011-20, pp. 1-6, July 2011.
Paper # EMD2011-20 
Date of Issue 2011-07-08 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2011-61 EMD2011-20 Link to ES Tech. Rep. Archives: EMD2011-20

Conference Information
Committee EMD EMCJ  
Conference Date 2011-07-15 - 2011-07-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Discharge, EMC, etc. 
Paper Information
Registration To EMD 
Conference Code 2011-07-EMD-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) Contact resistance (16) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) hammering oscillating mechanism  
Keyword(6) natural frequency  
Keyword(7) damping ratio  
Keyword(8) frictional force  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Masahiro Kawanobe  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Naoki Masuda  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Akira Ishiguro  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Kunio Yanagi  
7th Author's Affiliation TMC System Co. Ltd. (TMC)
8th Author's Name Hiroaki Kubota  
8th Author's Affiliation TMC System Co. Ltd. (TMC)
9th Author's Name Koichiro Sawa  
9th Author's Affiliation Nippon Institute of Technology (NIT)
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Date Time 2011-07-15 12:20:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMCJ2011-61,IEICE-EMD2011-20 
Volume (vol) IEICE-111 
Number (no) no.137(EMCJ), no.138(EMD) 
Page pp.1-6 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2011-07-08,IEICE-EMD-2011-07-08 

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