IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-07-15 12:45
Degradation Phenomenon of Electrical Contacts by a Tapping Device -- A tapping device for trial (3) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Koki Takeda, Daiki Ishizuka, Kunio Yanagi, Hiroaki Kubota (TMC), Nobuhiro Kuga (YNU), Koichiro Sawa (NIT) EMCJ2011-62 EMD2011-21 Link to ES Tech. Rep. Archives: EMD2011-21
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection but with quantitative property to some extent. It was suggested that the device could provide the oscillations for the objects with constant loads and energies but without regard to proficient operators’ skills. And it was shown that the dynamical characteristics of the device were able to be analyzed by virtue of mathematical and mechanical models. In this paper, the authors noted a tip of the device and analyzed dynamical characteristics of the visco-elastic material by means of several methods. Consequently the spring constant k and the coefficient of viscosity c were estimated approximately.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / tapping device / load / impulse / spring constant / coefficient of viscosity  
Reference Info. IEICE Tech. Rep., vol. 111, no. 138, EMD2011-21, pp. 7-12, July 2011.
Paper # EMD2011-21 
Date of Issue 2011-07-08 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2011-62 EMD2011-21 Link to ES Tech. Rep. Archives: EMD2011-21

Conference Information
Committee EMD EMCJ  
Conference Date 2011-07-15 - 2011-07-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Discharge, EMC, etc. 
Paper Information
Registration To EMD 
Conference Code 2011-07-EMD-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by a Tapping Device 
Sub Title (in English) A tapping device for trial (3) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) tapping device  
Keyword(5) load  
Keyword(6) impulse  
Keyword(7) spring constant  
Keyword(8) coefficient of viscosity  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Masahiro Kawanobe  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Koki Takeda  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Daiki Ishizuka  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Kunio Yanagi  
7th Author's Affiliation TMC System Co. Ltd. (TMC)
8th Author's Name Hiroaki Kubota  
8th Author's Affiliation TMC System Co. Ltd. (TMC)
9th Author's Name Nobuhiro Kuga  
9th Author's Affiliation Yokohama National University (YNU)
10th Author's Name Koichiro Sawa  
10th Author's Affiliation Nippon Institute of Technology (NIT)
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2011-07-15 12:45:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMCJ2011-62,IEICE-EMD2011-21 
Volume (vol) IEICE-111 
Number (no) no.137(EMCJ), no.138(EMD) 
Page pp.7-12 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2011-07-08,IEICE-EMD-2011-07-08 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan