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| Presentation | 2011-07-04 11:00 Dependence of carrier traps at SiO2/Si interfaces on Si surface orientation studied by XPS time-dependent measurement Yuri Ishihara (Shibaura Inst.Tech), Yasuhiro Shibuya, Satoshi Igarashi (Tokyo City Univ.), Daisuke Kobayashi (ISAS/JAXA), Hiroshi Nohira (Tokyo City Univ.), Kazuyoshi Ueno (Shibaura Inst.Tech), Kazuyuki Hirose (ISAS/JAXA)  SDM2011-55 Link to ES Tech. Rep. Archives: SDM2011-55 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 114, SDM2011-55, pp. 29-34, July 2011. | |
| Paper # | SDM2011-55 | |
| Date of Issue | 2011-06-27 (SDM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2011-55 Link to ES Tech. Rep. Archives: SDM2011-55 |
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| Conference Information | |
| Committee | SDM |
| Conference Date | 2011-07-04 - 2011-07-04 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | VBL, Nagoya Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Science and Technology for Dielectric Thin Films for Electron Devices |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2011-07-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dependence of carrier traps at SiO2/Si interfaces on Si surface orientation studied by XPS time-dependent measurement |
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| 1st Author's Name | Yuri Ishihara |
| 1st Author's Affiliation | Shibaura Institute of Technology (Shibaura Inst.Tech) |
| 2nd Author's Name | Yasuhiro Shibuya |
| 2nd Author's Affiliation | Tokyo city University (Tokyo City Univ.) |
| 3rd Author's Name | Satoshi Igarashi |
| 3rd Author's Affiliation | Tokyo city University (Tokyo City Univ.) |
| 4th Author's Name | Daisuke Kobayashi |
| 4th Author's Affiliation | ISAS/JAXA (ISAS/JAXA) |
| 5th Author's Name | Hiroshi Nohira |
| 5th Author's Affiliation | Tokyo city University (Tokyo City Univ.) |
| 6th Author's Name | Kazuyoshi Ueno |
| 6th Author's Affiliation | Shibaura Institute of Technology (Shibaura Inst.Tech) |
| 7th Author's Name | Kazuyuki Hirose |
| 7th Author's Affiliation | ISAS/JAXA (ISAS/JAXA) |
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| Speaker | Author-1 |
| Date Time | 2011-07-04 11:00:00 |
| Presentation Time | 20 minutes |
| Registration for | SDM |
| Paper # | SDM2011-55 |
| Volume (vol) | vol.111 |
| Number (no) | no.114 |
| Page | pp.29-34 |
| #Pages | 6 |
| Date of Issue | 2011-06-27 (SDM) |
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