IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-05-20 15:00
An experimental study on an evaluation system of a contact surface profile with an optical cross-section method (II)
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) EMD2011-5 Link to ES Tech. Rep. Archives: EMD2011-5
Abstract (in Japanese) (See Japanese page) 
(in English) Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during switching operations. Conventionally, erosion and transfer characteristics of various contact materials under different load conditions have been mainly studied based on observation and evaluation of contact surfaces after switching operation tests. On the other hand, a further detailed study will become possible if we can observe and numerically evaluate a changing process of surface damages (especially, growth of a crater and/or a pip) on contact surfaces during switching operations. For that purpose, a numerical evaluation system of contact surface damages by way of an optical cross-section method is being constructed. In this paper, Ag contacts were operated to break a DC inductive 14V-1A or 2A load current for 50,000 operations. During the switching operations, the movable contact (cathode) surface profile (a crater growth process) was numerically evaluated with the optical cross-section method, and further, the counterpart fixed contact (anode) surface profile (a pip growth process) was also observed with an additional camera system.
Keyword (in Japanese) (See Japanese page) 
(in English) optical cross-section method / electrical contacts / arc discharge / crater shape / material transfer / erosion / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 55, EMD2011-5, pp. 21-26, May 2011.
Paper # EMD2011-5 
Date of Issue 2011-05-13 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-5 Link to ES Tech. Rep. Archives: EMD2011-5

Conference Information
Committee EMD  
Conference Date 2011-05-20 - 2011-05-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. Cyber-Science Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2011-05-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An experimental study on an evaluation system of a contact surface profile with an optical cross-section method (II) 
Sub Title (in English)  
Keyword(1) optical cross-section method  
Keyword(2) electrical contacts  
Keyword(3) arc discharge  
Keyword(4) crater shape  
Keyword(5) material transfer  
Keyword(6) erosion  
1st Author's Name Keisuke Takahashi  
1st Author's Affiliation Chitose Institute of Science and Technology (Chitose Inst. of Sci. & Tech.)
2nd Author's Name Makoto Hasegawa  
2nd Author's Affiliation Chitose Institute of Science and Technology (Chitose Inst. of Sci. & Tech.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2011-05-20 15:00:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2011-5 
Volume (vol) IEICE-111 
Number (no) no.55 
Page pp.21-26 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2011-05-13 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan