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Paper Abstract and Keywords
Presentation 2011-05-20 15:50
Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7 Link to ES Tech. Rep. Archives: EMD2011-7
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering oscillation mechanism in the vertical direction. In this paper, using hammering oscillating mechanism and micro-sliding mechanism, It was considered that the characteristics of the above two mechanisms and the degradation phenomenon of electrical contacts. Though the two mechanisms have very different principles each other so that by hammering and by sliding, it was shown that there was common characteristics about natural frequency and damping ratio of the mechanisms on the influence of the electrical contacts.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / micro-sliding mechanism, / natural frequency / damping ratio / frictional force  
Reference Info. IEICE Tech. Rep., vol. 111, no. 55, EMD2011-7, pp. 33-38, May 2011.
Paper # EMD2011-7 
Date of Issue 2011-05-13 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-7 Link to ES Tech. Rep. Archives: EMD2011-7

Conference Information
Committee EMD  
Conference Date 2011-05-20 - 2011-05-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. Cyber-Science Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2011-05-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) Contact resistance 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) micro-sliding mechanism,  
Keyword(6) natural frequency  
Keyword(7) damping ratio  
Keyword(8) frictional force  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Saindaa Norovling  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Masahiro Kawanobe  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Hiroaki Kubota  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Koichiro Sawa  
6th Author's Affiliation Nippon Institute of Thechnology (NIT)
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Speaker
Date Time 2011-05-20 15:50:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2011-7 
Volume (vol) IEICE-111 
Number (no) no.55 
Page pp.33-38 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2011-05-13 


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