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Paper Abstract and Keywords
Presentation 2011-05-12 13:55
Evaluation of reliability enhancement achieved by fault avoidance on dynamically reconfigurable architectures
Hiroaki Konoura (Osaka Univ.), Yukio Mitsuyama (Kochi Univ. Tech.), Masanori Hashimoto, Takao Onoye (Osaka Univ.) RECONF2011-6
Abstract (in Japanese) (See Japanese page) 
(in English) For wear-out failures, some fault avoidance methods on dynamically reconfigurable devices have been discussed. In order to discuss the efficiency of these fault avoidance methods, the life-time extension achieved by them should be evaluated and compared quantitatively. This paper shows quantitative life-time evaluation results on dynamically reconfigurable devices with five fault avoidance methods. Experimental results reveal 1) MTTF (Mean Time To Failure) is highly correlated with the number of avoided faults, 2) there is the efficiency difference of spare usage in five fault avoidance methods, and 3) spares should be prevented from wear-out not to spoil life-time enhancement.
Keyword (in Japanese) (See Japanese page) 
(in English) Fault avoidance / Partial placing and routing / MTTF (Mean Time To Failure) / / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 31, RECONF2011-6, pp. 31-36, May 2011.
Paper # RECONF2011-6 
Date of Issue 2011-05-05 (RECONF) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF RECONF2011-6

Conference Information
Committee RECONF  
Conference Date 2011-05-12 - 2011-05-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. (Faculty of Eng., B3 Bldg.) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reconfigurable Systems, etc. 
Paper Information
Registration To RECONF 
Conference Code 2011-05-RECONF 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of reliability enhancement achieved by fault avoidance on dynamically reconfigurable architectures 
Sub Title (in English)  
Keyword(1) Fault avoidance  
Keyword(2) Partial placing and routing  
Keyword(3) MTTF (Mean Time To Failure)  
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1st Author's Name Hiroaki Konoura  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Yukio Mitsuyama  
2nd Author's Affiliation Kochi University of Technology (Kochi Univ. Tech.)
3rd Author's Name Masanori Hashimoto  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name Takao Onoye  
4th Author's Affiliation Osaka University (Osaka Univ.)
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Speaker
Date Time 2011-05-12 13:55:00 
Presentation Time 25 
Registration for RECONF 
Paper # IEICE-RECONF2011-6 
Volume (vol) IEICE-111 
Number (no) no.31 
Page pp.31-36 
#Pages IEICE-6 
Date of Issue IEICE-RECONF-2011-05-05 


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