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| Presentation | 2011-02-24 12:00 Characterization of Single-Electron Stochastic Resonance in A Quantum Dot and Its Parallel Network Seiya Kasai (Hokkaido Univ./JST), Yuta Shiratori, Kensuke Miura, Yuki Nakano (Hokkaido Univ.)  ED2010-206 SDM2010-241 Link to ES Tech. Rep. Archives: ED2010-206 SDM2010-241 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We investigate the effect of physical variation on single-electron stochastic resonance (SE-SR) in the quantum-dot parallel summing network. Analysis is carried out using a commercial single electron circuit simulator. The SR response in each dot is changed when the dot capacitance is changed, corresponding with the dot size variation. However, the total response of the network system integrating varied dots is found to converge to that of the system consisting uniform dots. This result is quite different from the behavior of the varied threshold-voltage FET network, where the response obeys the envelope of response curve from each device. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Stochastic Resonance / Single Electron / Quantum Dot / Thermal Fluctuation / Variation / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 423, ED2010-206, pp. 79-82, Feb. 2011. | |
| Paper # | ED2010-206 | |
| Date of Issue | 2011-02-16 (ED, SDM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ED2010-206 SDM2010-241 Link to ES Tech. Rep. Archives: ED2010-206 SDM2010-241 |
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| Conference Information | |
| Committee | SDM ED |
| Conference Date | 2011-02-23 - 2011-02-24 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hokkaido Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Functional nanodevices and related technologies |
| Paper Information | |
| Registration To | ED |
| Conference Code | 2011-02-SDM-ED |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Characterization of Single-Electron Stochastic Resonance in A Quantum Dot and Its Parallel Network |
| Sub Title (in English) | |
| Keyword(1) | Stochastic Resonance |
| Keyword(2) | Single Electron |
| Keyword(3) | Quantum Dot |
| Keyword(4) | Thermal Fluctuation |
| Keyword(5) | Variation |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Seiya Kasai |
| 1st Author's Affiliation | Hokkaido University/JST (Hokkaido Univ./JST) |
| 2nd Author's Name | Yuta Shiratori |
| 2nd Author's Affiliation | Hokkaido University (Hokkaido Univ.) |
| 3rd Author's Name | Kensuke Miura |
| 3rd Author's Affiliation | Hokkaido University (Hokkaido Univ.) |
| 4th Author's Name | Yuki Nakano |
| 4th Author's Affiliation | Hokkaido University (Hokkaido Univ.) |
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| Speaker | Author-1 |
| Date Time | 2011-02-24 12:00:00 |
| Presentation Time | 25 minutes |
| Registration for | ED |
| Paper # | ED2010-206, SDM2010-241 |
| Volume (vol) | vol.110 |
| Number (no) | no.423(ED), no.424(SDM) |
| Page | pp.79-82 |
| #Pages | 4 |
| Date of Issue | 2011-02-16 (ED, SDM) |
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