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Paper Abstract and Keywords
Presentation 2011-02-23 16:55
Capacitance measurements of sub-micron Al junctions using SQUID resonance
Kento Kikuchi, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (Univ. of Electro-Comm.) ED2010-199 SDM2010-234 Link to ES Tech. Rep. Archives: ED2010-199 SDM2010-234
Abstract (in Japanese) (See Japanese page) 
(in English) It is necessary to extract the capacitances, resistances and inductances experimentally for fabrication sub-micron Al junction device. We have obtained these device parameters using SQUID resonance techniques with sub-micron Al junctions evaluated by means of direct current injections. The results of capacitance are 54~170fF/μm2 .
Keyword (in Japanese) (See Japanese page) 
(in English) Superconductor / Josephson-Junction / SQUID / tunnel junction / inductance / capacitance / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 423, ED2010-199, pp. 43-48, Feb. 2011.
Paper # ED2010-199 
Date of Issue 2011-02-16 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2010-199 SDM2010-234 Link to ES Tech. Rep. Archives: ED2010-199 SDM2010-234

Conference Information
Committee SDM ED  
Conference Date 2011-02-23 - 2011-02-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To ED 
Conference Code 2011-02-SDM-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Capacitance measurements of sub-micron Al junctions using SQUID resonance 
Sub Title (in English)  
Keyword(1) Superconductor  
Keyword(2) Josephson-Junction  
Keyword(3) SQUID  
Keyword(4) tunnel junction  
Keyword(5) inductance  
Keyword(6) capacitance  
Keyword(7)  
Keyword(8)  
1st Author's Name Kento Kikuchi  
1st Author's Affiliation The University of Electro-Communications (Univ. of Electro-Comm.)
2nd Author's Name Masataka Moriya  
2nd Author's Affiliation The University of Electro-Communications (Univ. of Electro-Comm.)
3rd Author's Name Hiroshi Shimada  
3rd Author's Affiliation The University of Electro-Communications (Univ. of Electro-Comm.)
4th Author's Name Yoshinao Mizugaki  
4th Author's Affiliation The University of Electro-Communications (Univ. of Electro-Comm.)
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Speaker Author-1 
Date Time 2011-02-23 16:55:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2010-199, SDM2010-234 
Volume (vol) vol.110 
Number (no) no.423(ED), no.424(SDM) 
Page pp.43-48 
#Pages
Date of Issue 2011-02-16 (ED, SDM) 


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