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| Presentation | 2011-02-18 15:50 Statistical Quality Control based on Early Life Failure Rate for Electronic Components Toshinari Matsuoka (MELCO)  R2010-48 EMD2010-149 Link to ES Tech. Rep. Archives: EMD2010-149 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Basically, a manufacturing process of electronic components is complex and demanding.Therefore, in order to achieve a quality target, it is difficult to control variation of manufacturing condition only depending on manufacturing capability.Accordingly, it is required to establish some repeated screening processes such as inspection and aging, so as to prevent any outflow of units which have shorter life duration than a target.In other words, for electronic components, the useful life and the quality in field (Early Life Failure Rate) is heavily dependent on the screening capability.Moreover, in order to achieve a quality target, it is required to validate the capability at the prototype stage, so as to reflect it as a control standard for a performance data at an inspection process any later than mass production starts. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | EFR / SQC / Hazard / Weibull / Qualification / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 415, R2010-48, pp. 37-42, Feb. 2011. | |
| Paper # | R2010-48 | |
| Date of Issue | 2011-02-11 (R, EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2010-48 EMD2010-149 Link to ES Tech. Rep. Archives: EMD2010-149 |
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| Conference Information | |
| Committee | EMD R |
| Conference Date | 2011-02-18 - 2011-02-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Shizuoka Univ. (Hamamatsu) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | R |
| Conference Code | 2011-02-EMD-R |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Statistical Quality Control based on Early Life Failure Rate for Electronic Components |
| Sub Title (in English) | |
| Keyword(1) | EFR |
| Keyword(2) | SQC |
| Keyword(3) | Hazard |
| Keyword(4) | Weibull |
| Keyword(5) | Qualification |
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| 1st Author's Name | Toshinari Matsuoka |
| 1st Author's Affiliation | MitsubishiElectric corp. (MELCO) |
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| Speaker | Author-1 |
| Date Time | 2011-02-18 15:50:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2010-48, EMD2010-149 |
| Volume (vol) | vol.110 |
| Number (no) | no.415(R), no.416(EMD) |
| Page | pp.37-42 |
| #Pages | 6 |
| Date of Issue | 2011-02-11 (R, EMD) |
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