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| Presentation | 2011-02-18 15:00 Detection of degradation sign of LSI operation using IDDQ Shunsuke Sakamoto, Masaru Sanada (KUT)  R2010-46 EMD2010-147 Link to ES Tech. Rep. Archives: EMD2010-147 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | VDD supply current (IDDQ) information has been applied to detect LSI evaluation technology, IDDQ which has high fault detection sensitivity comparison with logic information. We used the IDDQ data to confirm degradation sign of LSI operation. For identification of early degradation with tiny leakage current, and clear detection of leakage current value growth brought with degradation progress, mathematical analysis way is worked. The technology is that data between test vector number versus IDDQ value is converted by Fourier transformation and is fabricated to power spectrum, which actualizes degradation sign. As a result, progress from tiny change of about 1/1000 on normal value was measured. Controversial points are discussed for prediction times of circuit operation down. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | IDDQ / LSI / Degradation / Fourier Transformation / Power spectrum / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 415, R2010-46, pp. 25-30, Feb. 2011. | |
| Paper # | R2010-46 | |
| Date of Issue | 2011-02-11 (R, EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2010-46 EMD2010-147 Link to ES Tech. Rep. Archives: EMD2010-147 |
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| Conference Information | |
| Committee | EMD R |
| Conference Date | 2011-02-18 - 2011-02-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Shizuoka Univ. (Hamamatsu) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | R |
| Conference Code | 2011-02-EMD-R |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Detection of degradation sign of LSI operation using IDDQ |
| Sub Title (in English) | |
| Keyword(1) | IDDQ |
| Keyword(2) | LSI |
| Keyword(3) | Degradation |
| Keyword(4) | Fourier Transformation |
| Keyword(5) | Power spectrum |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shunsuke Sakamoto |
| 1st Author's Affiliation | Kochi University of Technology (KUT) |
| 2nd Author's Name | Masaru Sanada |
| 2nd Author's Affiliation | Kochi University of Technology (KUT) |
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| Speaker | Author-1 |
| Date Time | 2011-02-18 15:00:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2010-46, EMD2010-147 |
| Volume (vol) | vol.110 |
| Number (no) | no.415(R), no.416(EMD) |
| Page | pp.25-30 |
| #Pages | 6 |
| Date of Issue | 2011-02-11 (R, EMD) |
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