Paper Abstract and Keywords |
Presentation |
2011-02-14 14:35
Test Pattern Selection for Defect-Aware Test Hiroshi Furutani, Takao Sakai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2010-66 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
With shrinking of LSIs, the diversification of defective mode due to defects becomes a critical issue. Therefore, test patterns for stuck-at faults and transition faults are insufficient to detect such defects.
In this paper, we propose metrics based on the fault excitation functions and the propagation path function to evaluate test patterns for transition faults. We also propose the method for selecting the test patterns from the n-detection test set. From the experimental results, we show that the set of selected test patterns can detect more fault models under the less number of test patterns. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
defect / defect-aware test / fault excitation function / method for selecting test patterns / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 413, DC2010-66, pp. 45-50, Feb. 2011. |
Paper # |
DC2010-66 |
Date of Issue |
2011-02-07 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2010-66 |
Conference Information |
Committee |
DC |
Conference Date |
2011-02-14 - 2011-02-14 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2011-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Test Pattern Selection for Defect-Aware Test |
Sub Title (in English) |
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Keyword(1) |
defect |
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defect-aware test |
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fault excitation function |
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method for selecting test patterns |
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1st Author's Name |
Hiroshi Furutani |
1st Author's Affiliation |
Ehime University (Ehime Univ.) |
2nd Author's Name |
Takao Sakai |
2nd Author's Affiliation |
Ehime University (Ehime Univ.) |
3rd Author's Name |
Yoshinobu Higami |
3rd Author's Affiliation |
Ehime University (Ehime Univ.) |
4th Author's Name |
Hiroshi Takahashi |
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Ehime University (Ehime Univ.) |
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Speaker |
Author-1 |
Date Time |
2011-02-14 14:35:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2010-66 |
Volume (vol) |
vol.110 |
Number (no) |
no.413 |
Page |
pp.45-50 |
#Pages |
6 |
Date of Issue |
2011-02-07 (DC) |
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