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Paper Abstract and Keywords
Presentation 2011-02-14 10:25
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors
Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60
Abstract (in Japanese) (See Japanese page) 
(in English) Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
Keyword (in Japanese) (See Japanese page) 
(in English) At-speed testing / ATPG / Low-power-test / Capture-safety checking / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 413, DC2010-60, pp. 7-12, Feb. 2011.
Paper # DC2010-60 
Date of Issue 2011-02-07 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2011-02-14 - 2011-02-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2011-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors 
Sub Title (in English)  
Keyword(1) At-speed testing  
Keyword(2) ATPG  
Keyword(3) Low-power-test  
Keyword(4) Capture-safety checking  
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1st Author's Name Ryota Sakai  
1st Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
2nd Author's Name Kohei Miyase  
2nd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
3rd Author's Name Xiaoqing Wen  
3rd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
4th Author's Name Masao Aso  
4th Author's Affiliation Renesas Micro Systems Co., Ltd. (RMS)
5th Author's Name Hiroshi Furukawa  
5th Author's Affiliation Renesas Micro Systems (RMS)
6th Author's Name Yuta Yamato  
6th Author's Affiliation Fukuoka Industry, Science & Technology Fundation (Fukuoka Ind. Sci & Tech/Fundation FIST)
7th Author's Name Seiji Kajihara  
7th Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
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Speaker
Date Time 2011-02-14 10:25:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-DC2010-60 
Volume (vol) IEICE-110 
Number (no) no.413 
Page pp.7-12 
#Pages IEICE-6 
Date of Issue IEICE-DC-2011-02-07 


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