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| Presentation | 2011-01-28 16:05 Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) -- Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT)  EMD2010-142 Link to ES Tech. Rep. Archives: EMD2010-142 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection but with quantitative property to some extent. It was suggested that the device could provide the oscillations for the objects with constant loads and energies but without regard to proficient operators' skills. And it was shown that mathematical & numerical analyzing models could be constructed for identifying the dynamical characteristics of the device and that the models would be approximately effective to do the analysis. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-oscillation / tapping device / mathematical analysis / numerical analysis / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 403, EMD2010-142, pp. 41-46, Jan. 2011. | |
| Paper # | EMD2010-142 | |
| Date of Issue | 2011-01-21 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2010-142 Link to ES Tech. Rep. Archives: EMD2010-142 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2011-01-28 - 2011-01-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Japan Aviation Electronics Industry,Limited |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Electromechanical Devices |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2011-01-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by a tapping device |
| Sub Title (in English) | A tapping device for trial (2) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | tapping device |
| Keyword(4) | mathematical analysis |
| Keyword(5) | numerical analysis |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Keiji Koshida |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 2nd Author's Name | Shin-ichi Wada |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 3rd Author's Name | Saindaa Norovling |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 4th Author's Name | Masahiro Kawanobe |
| 4th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 5th Author's Name | Masayoshi Kotabe |
| 5th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 6th Author's Name | Hiroaki Kubota |
| 6th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 7th Author's Name | Nobuhiro Kuga |
| 7th Author's Affiliation | Yokohama National University (Yokohama Nat'l Univ.) |
| 8th Author's Name | Koichiro Sawa |
| 8th Author's Affiliation | Nippon Institute of Technology (NIT) |
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| Speaker | Author-1 |
| Date Time | 2011-01-28 16:05:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2010-142 |
| Volume (vol) | vol.110 |
| Number (no) | no.403 |
| Page | pp.41-46 |
| #Pages | 6 |
| Date of Issue | 2011-01-21 (EMD) |
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