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Paper Abstract and Keywords
Presentation 2011-01-28 16:05
Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) --
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-142 Link to ES Tech. Rep. Archives: EMD2010-142
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection but with quantitative property to some extent. It was suggested that the device could provide the oscillations for the objects with constant loads and energies but without regard to proficient operators' skills. And it was shown that mathematical & numerical analyzing models could be constructed for identifying the dynamical characteristics of the device and that the models would be approximately effective to do the analysis.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / tapping device / mathematical analysis / numerical analysis / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 403, EMD2010-142, pp. 41-46, Jan. 2011.
Paper # EMD2010-142 
Date of Issue 2011-01-21 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-142 Link to ES Tech. Rep. Archives: EMD2010-142

Conference Information
Committee EMD  
Conference Date 2011-01-28 - 2011-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Japan Aviation Electronics Industry,Limited 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electromechanical Devices 
Paper Information
Registration To EMD 
Conference Code 2011-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by a tapping device 
Sub Title (in English) A tapping device for trial (2) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) tapping device  
Keyword(4) mathematical analysis  
Keyword(5) numerical analysis  
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Keyword(8)  
1st Author's Name Keiji Koshida  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Shin-ichi Wada  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Masahiro Kawanobe  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Masayoshi Kotabe  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Nobuhiro Kuga  
7th Author's Affiliation Yokohama National University (Yokohama Nat'l Univ.)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker
Date Time 2011-01-28 16:05:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2010-142 
Volume (vol) IEICE-110 
Number (no) no.403 
Page pp.41-46 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2011-01-21 


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