Paper Abstract and Keywords |
Presentation |
2011-01-21 10:50
Reflectometry Measurement with Free-Form Lighting Kaori Kikuchi (Ritsumeikan Univ.), Bruce Lamond, Abhijeet Ghosh (Univ. of Southern California), Pieter Peers (College of William & Mary), Paul Debevec (Univ. of Southern California), Ryosuke Ichikari, Hideyuki Tamura (Ritsumeikan Univ.) PRMU2010-181 MVE2010-106 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper introduces a prototype system for measurement of per-pixel appearance parameters. For example, diffuse albedo, specular albedo, surface normals and specular roughness. Some conventional techniques estimate BRDF from images under constructed illuminations. On the other hand, images are captured with a free-form hand-held light from a fixed viewpoint camera in our system. We employ a simple method using images which have only diffuse component for estimating light directions. Polarizer and image-based methods are used for separation of diffuse and specular components in general scenes. Additionally, image-based relighting is required for free-form light conditions to calculate reflectance properties of objects. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Bidirectional Reflectance Distribution Function / Image-based lighting / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 381, PRMU2010-181, pp. 273-278, Jan. 2011. |
Paper # |
PRMU2010-181 |
Date of Issue |
2011-01-13 (PRMU, MVE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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PRMU2010-181 MVE2010-106 |
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