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| Presentation | 2011-01-19 14:15 Electronic Properties of TiO2 Thin Films under UV Light Irradiation Yusuke Watanabe, Yuji Muramoto, Noriyuki Shimizu (Meijo Univ.)  OME2010-66 Link to ES Tech. Rep. Archives: OME2010-66 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | TiO2 has photocatalysis. When UV light irradiated, electron-hole pairs are generated in TiO2. The source of photocatalysis is oxidation and reduction reactions due to electrons and holes at the surface. In this paper, we tried to obtain the electronic properties such as resistivity, carrier density and mobility in anatase TiO2 thin films under UV light irradiation. The resistivity decreased with UV light intensity. Without UV light irradiation, the resistivity was high and over the measuring range. The measured values of the Hall voltage were not stable. We consider contributions to the Hall voltage of electrons and holes are canceled each other as in an intrinsic semiconductor. We consider the values of electron mobility and hole mobility are close as the reason for unstable behavior of Hall voltage. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | TiO2 / photoctalysis / resistivity / Hall voltage / carrier density / mobility / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 365, OME2010-66, pp. 39-43, Jan. 2011. | |
| Paper # | OME2010-66 | |
| Date of Issue | 2011-01-12 (OME) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | OME2010-66 Link to ES Tech. Rep. Archives: OME2010-66 |
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| Conference Information | |
| Committee | OME |
| Conference Date | 2011-01-19 - 2011-01-19 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | OME |
| Conference Code | 2011-01-OME |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Electronic Properties of TiO2 Thin Films under UV Light Irradiation |
| Sub Title (in English) | |
| Keyword(1) | TiO2 |
| Keyword(2) | photoctalysis |
| Keyword(3) | resistivity |
| Keyword(4) | Hall voltage |
| Keyword(5) | carrier density |
| Keyword(6) | mobility |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yusuke Watanabe |
| 1st Author's Affiliation | Meijo University (Meijo Univ.) |
| 2nd Author's Name | Yuji Muramoto |
| 2nd Author's Affiliation | Meijo University (Meijo Univ.) |
| 3rd Author's Name | Noriyuki Shimizu |
| 3rd Author's Affiliation | Meijo University (Meijo Univ.) |
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| Speaker | Author-1 |
| Date Time | 2011-01-19 14:15:00 |
| Presentation Time | 25 minutes |
| Registration for | OME |
| Paper # | OME2010-66 |
| Volume (vol) | vol.110 |
| Number (no) | no.365 |
| Page | pp.39-43 |
| #Pages | 5 |
| Date of Issue | 2011-01-12 (OME) |
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