IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-12-17 14:30
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (14) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132 Link to ES Tech. Rep. Archives: EMD2010-132
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering oscillation mechanism in the vertical direction. It was set that the oscillating acceleration was 150G, the frictional forces between male pins and female ones were 0.3N and each pin was connected respectively. When the measurement was carried out in the condition with 16 millions’ operations, the contact resistances fluctuated increasingly and the tendency of the fluctuation was different from each other. Therefore it was shown that there were the degradation tendencies of the connector depended upon the number and the amplitudes of the fluctuating contact resistance of pins. In addition it was shown that there were the similar tendencies in the initial term under 20,000 operations. Consequently it was suggested that a connector would be degraded by the influence of initial increasing contact resistance with a pin in the connector. And it was considered to be essential to analyze the time-sequential fluctuation of the contact resistance of each pin in a connector.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / acceleration / frictional force / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 350, EMD2010-132, pp. 17-22, Dec. 2010.
Paper # EMD2010-132 
Date of Issue 2010-12-10 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-132 Link to ES Tech. Rep. Archives: EMD2010-132

Conference Information
Committee EMD  
Conference Date 2010-12-17 - 2010-12-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Tamagawa University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2010-12-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Contact Resistance (14) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) acceleration  
Keyword(6) frictional force  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Saindaa Norovling  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Masahiro Kawanobe  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Masayoshi Kotabe  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Professor Emeritus Keio University/Nippon Institute of Technology (Professor Emeritus Keio Univ/Nippon Inst. of Tech.)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2010-12-17 14:30:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2010-132 
Volume (vol) IEICE-110 
Number (no) no.350 
Page pp.17-22 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2010-12-10 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan