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| Presentation | 2010-12-17 14:30 Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (14) -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.)  EMD2010-132 Link to ES Tech. Rep. Archives: EMD2010-132 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering oscillation mechanism in the vertical direction. It was set that the oscillating acceleration was 150G, the frictional forces between male pins and female ones were 0.3N and each pin was connected respectively. When the measurement was carried out in the condition with 16 millions’ operations, the contact resistances fluctuated increasingly and the tendency of the fluctuation was different from each other. Therefore it was shown that there were the degradation tendencies of the connector depended upon the number and the amplitudes of the fluctuating contact resistance of pins. In addition it was shown that there were the similar tendencies in the initial term under 20,000 operations. Consequently it was suggested that a connector would be degraded by the influence of initial increasing contact resistance with a pin in the connector. And it was considered to be essential to analyze the time-sequential fluctuation of the contact resistance of each pin in a connector. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / acceleration / frictional force / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 350, EMD2010-132, pp. 17-22, Dec. 2010. | |
| Paper # | EMD2010-132 | |
| Date of Issue | 2010-12-10 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2010-132 Link to ES Tech. Rep. Archives: EMD2010-132 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2010-12-17 - 2010-12-17 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Tamagawa University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2010-12-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
| Sub Title (in English) | Contact Resistance (14) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | hammering oscillating mechanism |
| Keyword(5) | acceleration |
| Keyword(6) | frictional force |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 2nd Author's Name | Saindaa Norovling |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 3rd Author's Name | Keiji Koshida |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 4th Author's Name | Masahiro Kawanobe |
| 4th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 5th Author's Name | Masayoshi Kotabe |
| 5th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 6th Author's Name | Hiroaki Kubota |
| 6th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 7th Author's Name | Koichiro Sawa |
| 7th Author's Affiliation | Professor Emeritus Keio University/Nippon Institute of Technology (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2010-12-17 14:30:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2010-132 |
| Volume (vol) | vol.110 |
| Number (no) | no.350 |
| Page | pp.17-22 |
| #Pages | 6 |
| Date of Issue | 2010-12-10 (EMD) |
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