IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-12-14 14:40
An Empirical Study on Relationship between Change History of Method Comments and Method Bugs
Hideaki Hata (Osaka Univ.), Osamu Mizuno (Kyoto Institute of Tech.), Tohru Kikuno (Osaka Univ.) SS2010-41
Abstract (in Japanese) (See Japanese page) 
(in English) Though comment statements are expected to help developers and users to
understand source code, improper comment statements might cause bugs.
For example, as source code evolve, its comment statement is expected
to be maintained to be consistent in the content of the related source
code. Many studies investigated the relation of source code changes and
bugs, and there are some studies reported the relation of comment
statements and bugs. However, to the best of our knowledge, there is
no studies targeting the relation of comment statement history and
bugs. In this paper, we target the relation of method bugs and the
history of method comment statements. We report the result of case
study with an open source software project.
Keyword (in Japanese) (See Japanese page) 
(in English) comment statement / method bug / method comment statement / comment statement history / fine-grained version control / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 336, SS2010-41, pp. 13-18, Dec. 2010.
Paper # SS2010-41 
Date of Issue 2010-12-07 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2010-41

Conference Information
Committee SS  
Conference Date 2010-12-14 - 2010-12-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Ikaho-Onsen Hotel Tenbo 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To SS 
Conference Code 2010-12-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Empirical Study on Relationship between Change History of Method Comments and Method Bugs 
Sub Title (in English)  
Keyword(1) comment statement  
Keyword(2) method bug  
Keyword(3) method comment statement  
Keyword(4) comment statement history  
Keyword(5) fine-grained version control  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hideaki Hata  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Osamu Mizuno  
2nd Author's Affiliation Kyoto Institute of Technology (Kyoto Institute of Tech.)
3rd Author's Name Tohru Kikuno  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2010-12-14 14:40:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2010-41 
Volume (vol) vol.110 
Number (no) no.336 
Page pp.13-18 
#Pages
Date of Issue 2010-12-07 (SS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan