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Paper Abstract and Keywords
Presentation 2010-12-01 11:05
A study of the success rate of MIA under various probability density function estimations
Yohei Hori (AIST), Takahiro Yoshida (Aoyama Univ.), Toshihiro Katashita, Akashi Satoh (AIST) RECONF2010-48
Abstract (in Japanese) (See Japanese page) 
(in English) The pfrobability density function (PDF) of voltage of AES hardware
module is estimated in various ways and applied to Mutual Information
Analysis Attacks (MIA). The efficiency of MIA attacks using different
PDFs are compared in terms of the number of wave traces required to
reveal the entire secret key.
Keyword (in Japanese) (See Japanese page) 
(in English) Side-channel attack / Mutual Information Analysis (MIA) / Advanced Encryption Standard (AES) / probability density function / Field-Programmable Gate Array (FPGA) / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 319, RECONF2010-48, pp. 55-60, Nov. 2010.
Paper # RECONF2010-48 
Date of Issue 2010-11-23 (RECONF) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF RECONF2010-48

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2010-11-29 - 2010-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 ―New Field of VLSI Design― 
Paper Information
Registration To RECONF 
Conference Code 2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study of the success rate of MIA under various probability density function estimations 
Sub Title (in English)  
Keyword(1) Side-channel attack  
Keyword(2) Mutual Information Analysis (MIA)  
Keyword(3) Advanced Encryption Standard (AES)  
Keyword(4) probability density function  
Keyword(5) Field-Programmable Gate Array (FPGA)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yohei Hori  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Takahiro Yoshida  
2nd Author's Affiliation Aoyama Gakuin University (Aoyama Univ.)
3rd Author's Name Toshihiro Katashita  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Akashi Satoh  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker
Date Time 2010-12-01 11:05:00 
Presentation Time 20 
Registration for RECONF 
Paper # IEICE-RECONF2010-48 
Volume (vol) IEICE-110 
Number (no) no.319 
Page pp.55-60 
#Pages IEICE-6 
Date of Issue IEICE-RECONF-2010-11-23 


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