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Paper Abstract and Keywords
Presentation 2010-12-01 10:10
Magnetic Field Measurement for Side-channel Analysis Environment
Toshihiro Katashita, Yohei Hori, Akashi Satoh (AIST) RECONF2010-46
Abstract (in Japanese) (See Japanese page) 
(in English) Cryptography used widely in electronic products is evaluated in terms of computationally-secure, however there is vulnerability of hardware modules to physical attacks. Side-channel attacks are one of noninvasive physical attacks, and are considered serious threats to cryptographic modules. Side-channel Attack Standard Evaluation Board (SASEBO) that is developed as a standard evaluation environment has measurement capability for power analysis. In this paper, we took experimentation in order to evaluate potential of SASEBO for near electromagnetic field measurement. EM signals of an AES circuit were measured and analyzed with CPA. Difference of magnetic field strength between locations of cryptographic circuit was also observed. As the result, we could explore the secret key of the AES circuit, and difference of magnetic field could be determined between locations that AES circuits were implemented on.
Keyword (in Japanese) (See Japanese page) 
(in English) Side-channel attack / Near magnetic field / Standard evaluation environment / Cryptography / FPGA / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 319, RECONF2010-46, pp. 43-48, Nov. 2010.
Paper # RECONF2010-46 
Date of Issue 2010-11-23 (RECONF) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF RECONF2010-46

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2010-11-29 - 2010-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 ―New Field of VLSI Design― 
Paper Information
Registration To RECONF 
Conference Code 2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Magnetic Field Measurement for Side-channel Analysis Environment 
Sub Title (in English)  
Keyword(1) Side-channel attack  
Keyword(2) Near magnetic field  
Keyword(3) Standard evaluation environment  
Keyword(4) Cryptography  
Keyword(5) FPGA  
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1st Author's Name Toshihiro Katashita  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Yohei Hori  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Akashi Satoh  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker
Date Time 2010-12-01 10:10:00 
Presentation Time 20 
Registration for RECONF 
Paper # IEICE-RECONF2010-46 
Volume (vol) IEICE-110 
Number (no) no.319 
Page pp.43-48 
#Pages IEICE-6 
Date of Issue IEICE-RECONF-2010-11-23 


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