Paper Abstract and Keywords |
Presentation |
2010-12-01 09:50
Fault-Injection using Virtualized Environment for Validating Automotive Systems Yasuhiro Ito (Hitachi.), Yohei Nakata, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST), Yasuo Sugure, Shigeru Oho (Hitachi.) VLD2010-73 DC2010-40 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Fault Injection System: a system level co-simulation environment with fault-injection in memory access was developed. It accepted a fault scenario that includes when and where memory failures occur, and imposed SRAM access failure. A virtual bus-bridge model added in a memory bus of target system disguised SRAM access failure by intervening memory transactions Consequently, it was possible to maintain the tartget system noninvasive from modification. This approach was adopted to a validation of vehicle engine control, as a result a ignition failure occured by SRAM fault was observed |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Fault Injection / Memory Error / System Simulation / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 317, DC2010-40, pp. 119-123, Nov. 2010. |
Paper # |
DC2010-40 |
Date of Issue |
2010-11-22 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2010-73 DC2010-40 |
Conference Information |
Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
Conference Date |
2010-11-29 - 2010-12-01 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kyushu University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2010 ―New Field of VLSI Design― |
Paper Information |
Registration To |
DC |
Conference Code |
2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Fault-Injection using Virtualized Environment for Validating Automotive Systems |
Sub Title (in English) |
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Keyword(1) |
Fault Injection |
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Memory Error |
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System Simulation |
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1st Author's Name |
Yasuhiro Ito |
1st Author's Affiliation |
Hitachi, Ltd. (Hitachi.) |
2nd Author's Name |
Yohei Nakata |
2nd Author's Affiliation |
Kobe University (Kobe Univ.) |
3rd Author's Name |
Hiroshi Kawaguchi |
3rd Author's Affiliation |
Kobe University (Kobe Univ.) |
4th Author's Name |
Masahiko Yoshimoto |
4th Author's Affiliation |
Kobe University/Japan Science and Technology Agency, CREST (Kobe Univ./JST) |
5th Author's Name |
Yasuo Sugure |
5th Author's Affiliation |
Hitachi, Ltd. (Hitachi.) |
6th Author's Name |
Shigeru Oho |
6th Author's Affiliation |
Hitachi, Ltd. (Hitachi.) |
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Speaker |
1 |
Date Time |
2010-12-01 09:50:00 |
Presentation Time |
20 |
Registration for |
DC |
Paper # |
IEICE-VLD2010-73,IEICE-DC2010-40 |
Volume (vol) |
IEICE-110 |
Number (no) |
no.316(VLD), no.317(DC) |
Page |
pp.119-123 |
#Pages |
IEICE-5 |
Date of Issue |
IEICE-VLD-2010-11-22,IEICE-DC-2010-11-22 |
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