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Paper Abstract and Keywords
Presentation 2010-12-01 09:50
Fault-Injection using Virtualized Environment for Validating Automotive Systems
Yasuhiro Ito (Hitachi.), Yohei Nakata, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST), Yasuo Sugure, Shigeru Oho (Hitachi.) VLD2010-73 DC2010-40
Abstract (in Japanese) (See Japanese page) 
(in English) Fault Injection System: a system level co-simulation environment with fault-injection in memory access was developed. It accepted a fault scenario that includes when and where memory failures occur, and imposed SRAM access failure. A virtual bus-bridge model added in a memory bus of target system disguised SRAM access failure by intervening memory transactions Consequently, it was possible to maintain the tartget system noninvasive from modification. This approach was adopted to a validation of vehicle engine control, as a result a ignition failure occured by SRAM fault was observed
Keyword (in Japanese) (See Japanese page) 
(in English) Fault Injection / Memory Error / System Simulation / / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 317, DC2010-40, pp. 119-123, Nov. 2010.
Paper # DC2010-40 
Date of Issue 2010-11-22 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2010-73 DC2010-40

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2010-11-29 - 2010-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 ―New Field of VLSI Design― 
Paper Information
Registration To DC 
Conference Code 2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fault-Injection using Virtualized Environment for Validating Automotive Systems 
Sub Title (in English)  
Keyword(1) Fault Injection  
Keyword(2) Memory Error  
Keyword(3) System Simulation  
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1st Author's Name Yasuhiro Ito  
1st Author's Affiliation Hitachi, Ltd. (Hitachi.)
2nd Author's Name Yohei Nakata  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Hiroshi Kawaguchi  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Masahiko Yoshimoto  
4th Author's Affiliation Kobe University/Japan Science and Technology Agency, CREST (Kobe Univ./JST)
5th Author's Name Yasuo Sugure  
5th Author's Affiliation Hitachi, Ltd. (Hitachi.)
6th Author's Name Shigeru Oho  
6th Author's Affiliation Hitachi, Ltd. (Hitachi.)
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Speaker
Date Time 2010-12-01 09:50:00 
Presentation Time 20 
Registration for DC 
Paper # IEICE-VLD2010-73,IEICE-DC2010-40 
Volume (vol) IEICE-110 
Number (no) no.316(VLD), no.317(DC) 
Page pp.119-123 
#Pages IEICE-5 
Date of Issue IEICE-VLD-2010-11-22,IEICE-DC-2010-11-22 


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