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Paper Abstract and Keywords
Presentation 2010-11-29 14:50
A Binding Algorithm for Multi-cycle Fault Tolerant Datapaths
Hayato Henmi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2010-60 DC2010-27
Abstract (in Japanese) (See Japanese page) 
(in English) As the advance in semiconductor technology, the issue of soft errors, which are transient glitches caused by particle strikes and high-energy cosmic rays, increases. In general, soft errors in today's high-speed VLSIs occur during multi-cycles, so that the VLSI system tolerable to the multi-cycle soft errors are required.
In this paper, we discuss high-level synthesis for fault-tolerant datapaths to multi-cycle soft errors. For triple module redundant datapaths, we clarify the condition of functional unit binding such that the multi-cycle errors in the synthesized datapaths are detectable and correctable. Based on this condition, we present a functional unit binding method for the datapaths that can correct multi-cycle soft errors.
Applications to some datapaths show that the proposed binding method can synthesize multi-cycle tolerant datapaths with small resources.
Keyword (in Japanese) (See Japanese page) 
(in English) High-level synthesis / Functional unit binding / Transient fault / Error detection/correction / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 317, DC2010-27, pp. 25-30, Nov. 2010.
Paper # DC2010-27 
Date of Issue 2010-11-22 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2010-60 DC2010-27

Conference Information
Conference Date 2010-11-29 - 2010-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 ―New Field of VLSI Design― 
Paper Information
Registration To DC 
Conference Code 2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Binding Algorithm for Multi-cycle Fault Tolerant Datapaths 
Sub Title (in English)  
Keyword(1) High-level synthesis  
Keyword(2) Functional unit binding  
Keyword(3) Transient fault  
Keyword(4) Error detection/correction  
1st Author's Name Hayato Henmi  
1st Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
2nd Author's Name Yuki Yoshikawa  
2nd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
3rd Author's Name Hideyuki Ichihara  
3rd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
4th Author's Name Tomoo Inoue  
4th Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
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Date Time 2010-11-29 14:50:00 
Presentation Time 20 
Registration for DC 
Paper # IEICE-VLD2010-60,IEICE-DC2010-27 
Volume (vol) IEICE-110 
Number (no) no.316(VLD), no.317(DC) 
Page pp.25-30 
#Pages IEICE-5 
Date of Issue IEICE-VLD-2010-11-22,IEICE-DC-2010-11-22 

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