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Paper Abstract and Keywords
Presentation 2010-11-29 15:45
A decision method of target detected pseudo primary outputs on Low-capture-swithing-activity test generation
Yang Shen, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ) VLD2010-62 DC2010-29
Abstract (in Japanese) (See Japanese page) 
(in English) High launch switching activity in capture mode during at-speed scan testing may lead to excessive IR-drop. Excessive IR-drop causes test-induced yield loss. A test pattern set is classified to a capture-safe pattern set and a capture-unsafe pattern set. If the launch switching activity exceeds the value of threshold, the test patterns are referred to capture-safe patterns. Other patterns are referred to capture-unsafe patterns. Faults detected by only capture-unsafe patterns are defined as unsafe faults. Other faults are defined as safe faults. It is important to generate capture-safe patterns for unsafe faults to avoid test-induced yield loss due to excessive IR-drop. In this paper, test patterns to unsafe faults for analysis are generated and the launch switching activity is analyzed. The information for a pair of a safe faults and its detected pseudo primary output is used for the analysis. Experimental results for ITC’99 benchmark circuits show that 90% of the test patterns for the analysis are capture-safe when a pseudo primary output where safe faults are detected by capture-safe patterns is the same as the pseudo primary output where safe faults are detected by test patterns for the analysis.
Keyword (in Japanese) (See Japanese page) 
(in English) capture power reduction / detected pseudo primary outputs / capture-safe / broad side testing / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 317, DC2010-29, pp. 37-42, Nov. 2010.
Paper # DC2010-29 
Date of Issue 2010-11-22 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2010-62 DC2010-29

Conference Information
Conference Date 2010-11-29 - 2010-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 ―New Field of VLSI Design― 
Paper Information
Registration To DC 
Conference Code 2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A decision method of target detected pseudo primary outputs on Low-capture-swithing-activity test generation 
Sub Title (in English)  
Keyword(1) capture power reduction  
Keyword(2) detected pseudo primary outputs  
Keyword(3) capture-safe  
Keyword(4) broad side testing  
1st Author's Name Yang Shen  
1st Author's Affiliation Nihon University (Nihon Univ)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ)
3rd Author's Name Masayoshi Yoshimura  
3rd Author's Affiliation Kyushu University (Kyushu Univ)
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Date Time 2010-11-29 15:45:00 
Presentation Time 20 
Registration for DC 
Paper # IEICE-VLD2010-62,IEICE-DC2010-29 
Volume (vol) IEICE-110 
Number (no) no.316(VLD), no.317(DC) 
Page pp.37-42 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2010-11-22,IEICE-DC-2010-11-22 

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