IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-11-26 14:20
A method for evaluating examination papers by chunking and slicing in assembly programming exercise
Yuichiro Tateiwa (NIT), Hirokazu Yoshida (Panasonic Advanced Technology Development), Daisuke Yamamoto, Naohisa Takahashi (NIT) ET2010-58
Abstract (in Japanese) (See Japanese page) 
(in English) We had developed a mechanism for automatically detecting program bugs of examination papers in assembly programming exercise. The mechanism verifies student program against correct answer program in behavior of programs, usage of machine resources in programs, and control structure of programs. However, we have noticed that it is hard for students to find out error statements which cause the bugs by analyzing the verification logs. Our purpose is to generate expression for assisting students to find out error statements. Consequently we propose methods for detecting bugs by chunk and narrowing scope of machine resource usage bugs by chunk and program slice. Since the method refines the scope more strongly than conventional one, the method is useful for development of more helpful debuggers and a function for providing more helpful hints in exercise.
Keyword (in Japanese) (See Japanese page) 
(in English) e-learning / automatic evaluation / dynamic backward slice / program slice / assembly programing / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 312, ET2010-58, pp. 53-58, Nov. 2010.
Paper # ET2010-58 
Date of Issue 2010-11-19 (ET) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ET2010-58

Conference Information
Committee ET  
Conference Date 2010-11-26 - 2010-11-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ET 
Conference Code 2010-11-ET 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A method for evaluating examination papers by chunking and slicing in assembly programming exercise 
Sub Title (in English)  
Keyword(1) e-learning  
Keyword(2) automatic evaluation  
Keyword(3) dynamic backward slice  
Keyword(4) program slice  
Keyword(5) assembly programing  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuichiro Tateiwa  
1st Author's Affiliation Nagoya Institute of Technology (NIT)
2nd Author's Name Hirokazu Yoshida  
2nd Author's Affiliation Panasonic Advanced Technology Development Co.,Ltd. (Panasonic Advanced Technology Development)
3rd Author's Name Daisuke Yamamoto  
3rd Author's Affiliation Nagoya Institute of Technology (NIT)
4th Author's Name Naohisa Takahashi  
4th Author's Affiliation Nagoya Institute of Technology (NIT)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2010-11-26 14:20:00 
Presentation Time 20 minutes 
Registration for ET 
Paper # ET2010-58 
Volume (vol) vol.110 
Number (no) no.312 
Page pp.53-58 
#Pages
Date of Issue 2010-11-19 (ET) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan