Paper Abstract and Keywords |
Presentation |
2010-11-25 13:00
Frequency dependence measurements of interface conductivity of copper-clad dielectric laminated substrates Masayuki Tsunemitsu (Saitama Univ.), Yoshio Kobayashi (SUMTEC, Inc.), Zhewang Ma (Saitama Univ.) MW2010-105 Link to ES Tech. Rep. Archives: MW2010-105 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The interface conductivity of copper-clad dielectric laminated substrates has been measured so far by the dielectric resonator method in the frequency range 5~20 GHz. This paper discusses the measurements below 5 GHz. At first the frequency dependence of the effective conductivity of two standard copper plates is measured by the two dielectric resonator method. Using the measured results, we measured the loss tangents of four high permittivity ceramic rods in 1.6~2.5 GHz. As a result, the frequency dependence measurements of copper-clad dielectric laminated substrates in the frequency range 1.6~20 GHz were performed successfully. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
copper-clad dielectric laminated substrate / conductivity measurement / microwave / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 307, MW2010-105, pp. 1-6, Nov. 2010. |
Paper # |
MW2010-105 |
Date of Issue |
2010-11-18 (MW) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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MW2010-105 Link to ES Tech. Rep. Archives: MW2010-105 |
Conference Information |
Committee |
MW |
Conference Date |
2010-11-25 - 2010-11-26 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tiruru |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
MW |
Conference Code |
2010-11-MW |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Frequency dependence measurements of interface conductivity of copper-clad dielectric laminated substrates |
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Keyword(1) |
copper-clad dielectric laminated substrate |
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conductivity measurement |
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microwave |
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1st Author's Name |
Masayuki Tsunemitsu |
1st Author's Affiliation |
Saitama University (Saitama Univ.) |
2nd Author's Name |
Yoshio Kobayashi |
2nd Author's Affiliation |
SUMTEC, Inc. (SUMTEC, Inc.) |
3rd Author's Name |
Zhewang Ma |
3rd Author's Affiliation |
Saitama University (Saitama Univ.) |
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Speaker |
Author-2 |
Date Time |
2010-11-25 13:00:00 |
Presentation Time |
25 minutes |
Registration for |
MW |
Paper # |
MW2010-105 |
Volume (vol) |
vol.110 |
Number (no) |
no.307 |
Page |
pp.1-6 |
#Pages |
6 |
Date of Issue |
2010-11-18 (MW) |
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