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Paper Abstract and Keywords
Presentation 2010-11-12 13:15
A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111 Link to ES Tech. Rep. Archives: EMD2010-111
Abstract (in Japanese) (See Japanese page) 
(in English) A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the vertical direction has been developed and the influences of a micro-oscillation on contact resistance have been studied. The mechanism could make a study of actual degradation phenomenon on contacts by the influences of a micro-oscillation.
First, a mathematical approach in the mechanism of hammering and consequently occurred oscillation using plate dynamic theory was carried out by linearly combination of some functions and a unit step functions as external force in time and space field. According to the approach, dynamical characteristics of the mechanism were analyzed by constructing a model of a thin plate with some initial conditions, boundary conditions and a transformation of wave functions. By comparing the modeling analysis with experimental results, it was shown that the model could express, to some extent, the actual oscillation on a thin plate.
Second, another mathematical approach in the interface on electrical contacts was carried out by considering both Coulomb’s frictional force and inertial force adding to the former model. By comparing the modeling method with experimental results, it was suggested that the method could explain, to some extent, the more actual oscillation on the thin plate.
By two models it was suggested that the dynamical characteristics of the mechanism, such as displacement, acceleration and mechanical energy, could be derived from linear combinations of basal functions. And using two methods it was thought, to some extent, that a source of the fluctuation of contact resistance caused by the hammering oscillation could be analyzed.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / contact resistance / degradation phenomenon / hammering oscillating mechanism / micro-oscillation / Coulomb’s frictional force / inertial force / mathematical model  
Reference Info. IEICE Tech. Rep., vol. 110, no. 270, EMD2010-111, pp. 185-188, Nov. 2010.
Paper # EMD2010-111 
Date of Issue 2010-11-04 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-111 Link to ES Tech. Rep. Archives: EMD2010-111

Conference Information
Committee EMD  
Conference Date 2010-11-11 - 2010-11-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Xi'an Jiaotong University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD2010 (10th International Session in Electro-Mechanical Devices) 
Paper Information
Registration To EMD 
Conference Code 2010-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism 
Sub Title (in English) Modeling (10) 
Keyword(1) electrical contact  
Keyword(2) contact resistance  
Keyword(3) degradation phenomenon  
Keyword(4) hammering oscillating mechanism  
Keyword(5) micro-oscillation  
Keyword(6) Coulomb’s frictional force  
Keyword(7) inertial force  
Keyword(8) mathematical model  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC System)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC System)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC System)
4th Author's Name Masayoshi Kotabe  
4th Author's Affiliation TMC System Co. Ltd. (TMC System)
5th Author's Name Hiroaki Kubota  
5th Author's Affiliation TMC System Co. Ltd. (TMC System)
6th Author's Name Koichiro Sawa  
6th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Date Time 2010-11-12 13:15:00 
Presentation Time 15 
Registration for EMD 
Paper # IEICE-EMD2010-111 
Volume (vol) IEICE-110 
Number (no) no.270 
Page pp.185-188 
#Pages IEICE-4 
Date of Issue IEICE-EMD-2010-11-04 

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