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Paper Abstract and Keywords
Presentation
2010-11-11 18:00
Measurement and Calculation of Eddy-Current Loss in Copper Shielding under DC Biased Excitation
Zhigang Zhao
,
Fugui Liu
,
Z.Cheng
,
Y.Du
,
L.Liu
,
J.Zhang
,
Y.Fan
,
Weili Yan
(
Hebei Univ. of Tech.
)
Abstract
(in Japanese)
(See Japanese page)
(in English)
(Not available yet)
Keyword
(in Japanese)
(See Japanese page)
(in English)
/ / / / / / /
Reference Info.
IEICE Tech. Rep.
Paper #
Date of Issue
ISSN
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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Conference Information
Committee
EMD
Conference Date
2010-11-11 - 2010-11-12
Place (in Japanese)
(See Japanese page)
Place (in English)
Xi'an Jiaotong University
Topics (in Japanese)
(See Japanese page)
Topics (in English)
IS-EMD2010 (10th International Session in Electro-Mechanical Devices)
Paper Information
Registration To
EMD
Conference Code
2010-11-EMD
Language
English
Title (in Japanese)
(See Japanese page)
Sub Title (in Japanese)
(See Japanese page)
Title (in English)
Measurement and Calculation of Eddy-Current Loss in Copper Shielding under DC Biased Excitation
Sub Title (in English)
Keyword(1)
Keyword(2)
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1st Author's Name
Zhigang Zhao
1st Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
2nd Author's Name
Fugui Liu
2nd Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
3rd Author's Name
Z.Cheng
3rd Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
4th Author's Name
Y.Du
4th Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
5th Author's Name
L.Liu
5th Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
6th Author's Name
J.Zhang
6th Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
7th Author's Name
Y.Fan
7th Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
8th Author's Name
Weili Yan
8th Author's Affiliation
Hebei University of Technology
(
Hebei Univ. of Tech.
)
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Speaker
1
Date Time
2010-11-11 18:00:00
Presentation Time
15
Registration for
EMD
Paper #
Volume (vol)
IEICE-110
Number (no)
no.270
Page
#Pages
IEICE-
Date of Issue
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