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Paper Abstract and Keywords
Presentation 2010-11-11 18:00
Measurement and Calculation of Eddy-Current Loss in Copper Shielding under DC Biased Excitation
Zhigang Zhao, Fugui Liu, Z.Cheng, Y.Du, L.Liu, J.Zhang, Y.Fan, Weili Yan (Hebei Univ. of Tech.)
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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Reference Info. IEICE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee EMD  
Conference Date 2010-11-11 - 2010-11-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Xi'an Jiaotong University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD2010 (10th International Session in Electro-Mechanical Devices) 
Paper Information
Registration To EMD 
Conference Code 2010-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement and Calculation of Eddy-Current Loss in Copper Shielding under DC Biased Excitation 
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1st Author's Name Zhigang Zhao  
1st Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
2nd Author's Name Fugui Liu  
2nd Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
3rd Author's Name Z.Cheng  
3rd Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
4th Author's Name Y.Du  
4th Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
5th Author's Name L.Liu  
5th Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
6th Author's Name J.Zhang  
6th Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
7th Author's Name Y.Fan  
7th Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
8th Author's Name Weili Yan  
8th Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
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Speaker
Date Time 2010-11-11 18:00:00 
Presentation Time 15 
Registration for EMD 
Paper #  
Volume (vol) IEICE-110 
Number (no) no.270 
Page  
#Pages IEICE- 
Date of Issue  


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