| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2010-11-11 11:00 Failure process and dynamic reliability estimation of sealed relay Xuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai (Harbin Inst. of Tech.)  EMD2010-76 Link to ES Tech. Rep. Archives: EMD2010-76 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Usually the failure rate of a sealed relay is regarded as a constant value, no matter where and how it is used. However, the failure processes of sealed relays won。ッt be the same under different conditions, even for one relay, its failure rate also will be changed during operations. This paper studies the failure process of a kind of sealed relay by analyzing the variations of its time parameters. Among contact resistance and all those time parameters, it is found that closing gap time can indicate the failure process of tested relay very well. For the purpose of verifying this conclusion derived from time parameters, the contacts are observed by microscope after the tested relay failed. Both theoretical calculation result of contacts gap and photos taken by microscope show that the hypothetic failure mode derived from time parameters is reasonable. Based on the failure analysis, the paper also proposes a dynamic reliability estimation method with closing gap time. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | sealed relay / failure process / time parameter / gap time / dynamic reliability estimation / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 270, EMD2010-76, pp. 41-44, Nov. 2010. | |
| Paper # | EMD2010-76 | |
| Date of Issue | 2010-11-04 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2010-76 Link to ES Tech. Rep. Archives: EMD2010-76 |
|
| Conference Information | |
| Committee | EMD |
| Conference Date | 2010-11-11 - 2010-11-12 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Xi'an Jiaotong University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | IS-EMD2010 (10th International Session in Electro-Mechanical Devices) |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2010-11-EMD |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Failure process and dynamic reliability estimation of sealed relay |
| Sub Title (in English) | |
| Keyword(1) | sealed relay |
| Keyword(2) | failure process |
| Keyword(3) | time parameter |
| Keyword(4) | gap time |
| Keyword(5) | dynamic reliability estimation |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Xuerong Ye |
| 1st Author's Affiliation | Harbin Institute of Technology (Harbin Inst. of Tech.) |
| 2nd Author's Name | Jie Deng |
| 2nd Author's Affiliation | Harbin Institute of Technology (Harbin Inst. of Tech.) |
| 3rd Author's Name | Qiong Yu |
| 3rd Author's Affiliation | Harbin Institute of Technology (Harbin Inst. of Tech.) |
| 4th Author's Name | Guofu Zhai |
| 4th Author's Affiliation | Harbin Institute of Technology (Harbin Inst. of Tech.) |
| 5th Author's Name | |
| 5th Author's Affiliation | () |
| 6th Author's Name | |
| 6th Author's Affiliation | () |
| 7th Author's Name | |
| 7th Author's Affiliation | () |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2010-11-11 11:00:00 |
| Presentation Time | 15 minutes |
| Registration for | EMD |
| Paper # | EMD2010-76 |
| Volume (vol) | vol.110 |
| Number (no) | no.270 |
| Page | pp.41-44 |
| #Pages | 4 |
| Date of Issue | 2010-11-04 (EMD) |
[Return to Top Page]