IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-10-29 15:30
High Reliable AlGaInAs Lasers by Improved Facet-Coating Processes
Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Nobuyuki Ikoma (SEI) OCS2010-83 OPE2010-119 LQE2010-92 Link to ES Tech. Rep. Archives: OPE2010-119 LQE2010-92
Abstract (in Japanese) (See Japanese page) 
(in English) AlGaInAs lasers are suitable for element devices of optical communication systems. However, degradations in forward-biased ESD tests and accelerated aging tests were found. Since both degradations occurred at the facet of the laser, we improved facet-coating processes. In forward-biased ESD tests, we introduced a passivation of an Al ultrathin layer just before facet-coating. The Al ultrathin layer prevents oxidation of the facet from oxygen atmosphere. The degradation ratio of 1 kV ESD tests was decreased from 40% to 0% by introducing the passivation. In accelerated aging tests of 200 mA at 85℃, we introduced facet-coating with compressive strain. This degradation differed completely from that caused by ESD; dislocation loops covered the entire active layer at the facet. The degradation ratio of 800 h aging was decreased from 5% to 0% by introducing the compressively strained facet-coating.
Keyword (in Japanese) (See Japanese page) 
(in English) AlGaInAs / Laser / Facet-coating / ESD / Reliability / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 259, LQE2010-92, pp. 157-162, Oct. 2010.
Paper # LQE2010-92 
Date of Issue 2010-10-21 (OCS, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OCS2010-83 OPE2010-119 LQE2010-92 Link to ES Tech. Rep. Archives: OPE2010-119 LQE2010-92

Conference Information
Committee LQE OPE OCS  
Conference Date 2010-10-28 - 2010-10-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Mojiko Retro Town, Minato house 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Ultrafast transmission,signal processing/modulation-demodulation/wideband amplification,WDM technology/light emitting-receiving device/high power light delivery/etc(report on ECOC) 
Paper Information
Registration To LQE 
Conference Code 2010-10-LQE-OPE-OCS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High Reliable AlGaInAs Lasers by Improved Facet-Coating Processes 
Sub Title (in English)  
Keyword(1) AlGaInAs  
Keyword(2) Laser  
Keyword(3) Facet-coating  
Keyword(4) ESD  
Keyword(5) Reliability  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hiroyuki Ichikawa  
1st Author's Affiliation Sumitomo Electric Industries, Ltd. (SEI)
2nd Author's Name Chie Fukuda  
2nd Author's Affiliation Sumitomo Electric Industries, Ltd. (SEI)
3rd Author's Name Shinji Matsukawa  
3rd Author's Affiliation Sumitomo Electric Industries, Ltd. (SEI)
4th Author's Name Nobuyuki Ikoma  
4th Author's Affiliation Sumitomo Electric Industries, Ltd. (SEI)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2010-10-29 15:30:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # OCS2010-83, OPE2010-119, LQE2010-92 
Volume (vol) vol.110 
Number (no) no.257(OCS), no.258(OPE), no.259(LQE) 
Page pp.157-162 
#Pages
Date of Issue 2010-10-21 (OCS, OPE, LQE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan