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Presentation 2010-10-25 13:50
Field Emission Properties of Nitrogen-doped Diamond Related with C-N Bond
Yuki Kudo (Univ. of Tsukuba/ICU), Tomoaki Masuzawa, Yusuke Sato (ICU), Ichitaro Saito (Univ. of Cambridge), Takatoshi Yamada (AIST), Angel Koh, Daniel. Chua (National Univ. of Singapore), Teruo Yoshino, W. J. Chun (ICU), Satoshi Yamasaki (AIST/Univ. of Tsukuba), Ken Okano (ICU) ED2010-130 Link to ES Tech. Rep. Archives: ED2010-130
Abstract (in Japanese) (See Japanese page) 
(in English) Electron field emission measurement and Time-of-flight secondary ion mass spectroscopy (TOF-SIMS) were carried out on nitrogen (N-) doped diamond films of two different impurity sources; urea and dimethylurea. Urea doped diamond films exhibited the strongest signal intensity of C-N bonds according to the TOF-SIMS results. As for the field emission properties, the enhancement factor  was characterised not only by Fowler-Nordheim (F-N) plot, but also by V-d plot where the voltage required for a certain value of emission current to flow was plotted against each anode-cathode distance. The largest  was acquired from the diamond film with the most C-N counts, and therefore more C-N maybe the key to enhancing electron field emission from N-doped diamond.
Keyword (in Japanese) (See Japanese page) 
(in English) nitrogen-doped diamond / dimethylurea / urea / field emission / enhancement factor / TOF-SIMS / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 249, ED2010-130, pp. 11-15, Oct. 2010.
Paper # ED2010-130 
Date of Issue 2010-10-18 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2010-130 Link to ES Tech. Rep. Archives: ED2010-130

Conference Information
Committee ED  
Conference Date 2010-10-25 - 2010-10-26 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Topics (in English)  
Paper Information
Registration To ED 
Conference Code 2010-10-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Field Emission Properties of Nitrogen-doped Diamond Related with C-N Bond 
Sub Title (in English)  
Keyword(1) nitrogen-doped diamond  
Keyword(2) dimethylurea  
Keyword(3) urea  
Keyword(4) field emission  
Keyword(5) enhancement factor  
Keyword(6) TOF-SIMS  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuki Kudo  
1st Author's Affiliation University of Tsukuba/International Christian University (Univ. of Tsukuba/ICU)
2nd Author's Name Tomoaki Masuzawa  
2nd Author's Affiliation International Christian University (ICU)
3rd Author's Name Yusuke Sato  
3rd Author's Affiliation International Christian University (ICU)
4th Author's Name Ichitaro Saito  
4th Author's Affiliation University of Cambridge (Univ. of Cambridge)
5th Author's Name Takatoshi Yamada  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name Angel Koh  
6th Author's Affiliation National University of Singapore (National Univ. of Singapore)
7th Author's Name Daniel. Chua  
7th Author's Affiliation National University of Singapore (National Univ. of Singapore)
8th Author's Name Teruo Yoshino  
8th Author's Affiliation International Christian University (ICU)
9th Author's Name W. J. Chun  
9th Author's Affiliation International Christian University (ICU)
10th Author's Name Satoshi Yamasaki  
10th Author's Affiliation National Institute of Advanced Industrial Science and Technology/University of Tsukuba (AIST/Univ. of Tsukuba)
11th Author's Name Ken Okano  
11th Author's Affiliation International Christian University (ICU)
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Speaker Author-1 
Date Time 2010-10-25 13:50:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2010-130 
Volume (vol) vol.110 
Number (no) no.249 
Page pp.11-15 
#Pages
Date of Issue 2010-10-18 (ED) 


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