Paper Abstract and Keywords |
Presentation |
2010-10-19 11:30
Analysis on Critical Current Spread of Nb-AlOx-Nb Josephson Junctions Kenji Hinode, Tetsuro Satoh, Shuichi Nagasawa, Mutsuo Hidaka (ISTEC) SCE2010-27 Link to ES Tech. Rep. Archives: SCE2010-27 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We studied the spread of the critical current (Ic) for Nb-AlOx-Nb Josephson junctions. Room temperature measurements for the junction resistance gave the reasonable dependence of the JJ area. Low temperature measurements of IV characteristics for serial JJ arrays gave the Ic spreads consisting of two components, one is the JJ area component and the other is originated from the noise of the measurement system and test circuits. We proposed the model explaining the noise-origin Ic spread. Estimation based on the model showed good agreement with the measured JJ-size dependence. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
niobium / Josephson junction / critical current / SFQ / critical current spread / JJ area / noise / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 235, SCE2010-27, pp. 19-24, Oct. 2010. |
Paper # |
SCE2010-27 |
Date of Issue |
2010-10-12 (SCE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SCE2010-27 Link to ES Tech. Rep. Archives: SCE2010-27 |
Conference Information |
Committee |
SCE |
Conference Date |
2010-10-19 - 2010-10-19 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Fundamental Technologies for Superconducting Electronics, etc. |
Paper Information |
Registration To |
SCE |
Conference Code |
2010-10-SCE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analysis on Critical Current Spread of Nb-AlOx-Nb Josephson Junctions |
Sub Title (in English) |
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Keyword(1) |
niobium |
Keyword(2) |
Josephson junction |
Keyword(3) |
critical current |
Keyword(4) |
SFQ |
Keyword(5) |
critical current spread |
Keyword(6) |
JJ area |
Keyword(7) |
noise |
Keyword(8) |
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1st Author's Name |
Kenji Hinode |
1st Author's Affiliation |
International Superconductivity Technology Center (ISTEC) |
2nd Author's Name |
Tetsuro Satoh |
2nd Author's Affiliation |
International Superconductivity Technology Center (ISTEC) |
3rd Author's Name |
Shuichi Nagasawa |
3rd Author's Affiliation |
International Superconductivity Technology Center (ISTEC) |
4th Author's Name |
Mutsuo Hidaka |
4th Author's Affiliation |
International Superconductivity Technology Center (ISTEC) |
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Speaker |
Author-1 |
Date Time |
2010-10-19 11:30:00 |
Presentation Time |
25 minutes |
Registration for |
SCE |
Paper # |
SCE2010-27 |
Volume (vol) |
vol.110 |
Number (no) |
no.235 |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2010-10-12 (SCE) |