| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2010-10-15 14:35 Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)  EMD2010-65 Link to ES Tech. Rep. Archives: EMD2010-65 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the conditions that (1) frictional forces were 2.0N or 0.3N and (2) sliding amplitudes were ±5.0μm or ±10.0μm under the operation number of about 25milions. It was studied that there were the parameters (frictional force and sliding amplitude) caused the relative displacements of the electrical contacts on the time-sequential fluctuations of the contact resistances. They measured increasing resistances on electrical contacts when current was 500mA. And it was suggested that the fretting corrosion model or sliding contact one would be indispensable to applied to the fluctuation of contact resistance in consideration of sliding amplitudes, frictional force and current. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-oscillation / contact resistance / sliding contact mechanism / sliding amplitude / frictional force / current / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 230, EMD2010-65, pp. 13-18, Oct. 2010. | |
| Paper # | EMD2010-65 | |
| Date of Issue | 2010-10-08 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2010-65 Link to ES Tech. Rep. Archives: EMD2010-65 |
|
| Conference Information | |
| Committee | EMD |
| Conference Date | 2010-10-15 - 2010-10-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | NTT Musashino Research and Development Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Electromechanical Devices |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2010-10-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
| Sub Title (in English) | Contact Resistance (13) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | sliding contact mechanism |
| Keyword(5) | sliding amplitude |
| Keyword(6) | frictional force |
| Keyword(7) | current |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 3rd Author's Name | Saindaa Norovling |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 4th Author's Name | Masayoshi Kotabe |
| 4th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 5th Author's Name | Hiroaki Kubota |
| 5th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 6th Author's Name | Koichiro Sawa |
| 6th Author's Affiliation | Nippon Institute of Technology (NIT) |
| 7th Author's Name | |
| 7th Author's Affiliation | () |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2010-10-15 14:35:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2010-65 |
| Volume (vol) | vol.110 |
| Number (no) | no.230 |
| Page | pp.13-18 |
| #Pages | 6 |
| Date of Issue | 2010-10-08 (EMD) |
[Return to Top Page]