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Paper Abstract and Keywords
Presentation 2010-10-06 09:45
[Invited Talk] Impact of DFR simulation from device to circuit
Kazuya Matsuzawa, Daisuke Hagishima, Takamitsu Ishihara (Advanced LSI Technology Lab. TOSHIBA)
Abstract (in Japanese) (See Japanese page) 
(in English) Long term-reliability must be considered in the value of LSI as well as function and performance. Conventionally, the LSI has been designed with margin determined by stacking reliabilities for simple layer structure or each device. Recently, results of reliability-test are becoming severer as device size is scaled down. Stacking their reliabilities makes design-windows narrower, and design-solution unattainable at worst. It could take time and cost expense to design LSI, and make launching products into market delay. Consequently, the very precise design for systems and circuits must be substantial. Moreover, attempt to concentrate resource for development by selecting component technologies could become indispensable. This presentation shows simulation approach for DFR to embed reliabilities in LSI products.
Keyword (in Japanese) (See Japanese page) 
(in English) DFR / Simulation / Reliability / NBTI / HCI / mixedmode / SEU / ESD  
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Conference Information
Committee CAS  
Conference Date 2010-10-06 - 2010-10-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Makuhari Messe 
Topics (in Japanese) (See Japanese page) 
Topics (in English) CEATEC2010 
Paper Information
Registration To CAS 
Conference Code 2010-10-CAS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Impact of DFR simulation from device to circuit 
Sub Title (in English)  
Keyword(1) DFR  
Keyword(2) Simulation  
Keyword(3) Reliability  
Keyword(4) NBTI  
Keyword(5) HCI  
Keyword(6) mixedmode  
Keyword(7) SEU  
Keyword(8) ESD  
1st Author's Name Kazuya Matsuzawa  
1st Author's Affiliation Advanced LSI Technology Laboratory TOSHIBA (Advanced LSI Technology Lab. TOSHIBA)
2nd Author's Name Daisuke Hagishima  
2nd Author's Affiliation Advanced LSI Technology Laboratory TOSHIBA (Advanced LSI Technology Lab. TOSHIBA)
3rd Author's Name Takamitsu Ishihara  
3rd Author's Affiliation Advanced LSI Technology Laboratory TOSHIBA (Advanced LSI Technology Lab. TOSHIBA)
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Speaker Author-1 
Date Time 2010-10-06 09:45:00 
Presentation Time 60 minutes 
Registration for CAS 
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