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Paper Abstract and Keywords
Presentation 2010-07-23 11:05
On-chip background calibration of time-interleaved ADC
Takashi Oshima, Tomomi Takahashi (Hitachi) ICD2010-34 Link to ES Tech. Rep. Archives: ICD2010-34
Abstract (in Japanese) (See Japanese page) 
(in English) An extremely-high-speed high-resolution time-interleaved ADC is a key enabler of the next-generation applications. The gain, offset and sampling-timing mismatches among unit ADCs of a time-interleaved ADC are compensated by the proposed background calibration, which is simple enough to be implemented on a single chip.
Keyword (in Japanese) (See Japanese page) 
(in English) time-interleaved ADC / digital calibration / mismatch / LMS algorithm / skew / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 140, ICD2010-34, pp. 79-84, July 2010.
Paper # ICD2010-34 
Date of Issue 2010-07-15 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2010-34 Link to ES Tech. Rep. Archives: ICD2010-34

Conference Information
Committee ICD ITE-IST  
Conference Date 2010-07-22 - 2010-07-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Josho Gakuen Osaka Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To ICD 
Conference Code 2010-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On-chip background calibration of time-interleaved ADC 
Sub Title (in English)  
Keyword(1) time-interleaved ADC  
Keyword(2) digital calibration  
Keyword(3) mismatch  
Keyword(4) LMS algorithm  
Keyword(5) skew  
1st Author's Name Takashi Oshima  
1st Author's Affiliation Hitachi Ltd. (Hitachi)
2nd Author's Name Tomomi Takahashi  
2nd Author's Affiliation Hitachi Ltd. (Hitachi)
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Date Time 2010-07-23 11:05:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-ICD2010-34 
Volume (vol) IEICE-110 
Number (no) no.140 
Page pp.79-84 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2010-07-15 

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