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| Presentation | 2010-07-22 14:00 [Invited Talk] Digitally-Assisted Analog Test Technology -- Analog Circuit Test Technology in Nano-CMOS Era -- Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.)  ICD2010-27 Link to ES Tech. Rep. Archives: ICD2010-27 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper reviews current production testing issues for analog and mixed-signal SoC, and discusses the following: (i) Digitally-assisted analog technology prevails in mixed-signal SoC with fine CMOS which uses digital-rich architecture, digital self-calibration and error corrction, and we consider their effective production testing. (ii) Mixed-signal SoCs frequently incorporate digital resources such as DSP cores and memory. We discuss how such resources can be utilized to simplify production testing of the analog RF circuitry in the SoC. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Digitally-Assisted Analog Technology / Digitally-Assisted Analog Test Technology / Design for Testability / Self-Calibration / Digital Error Correction / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 140, ICD2010-27, pp. 37-42, July 2010. | |
| Paper # | ICD2010-27 | |
| Date of Issue | 2010-07-15 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2010-27 Link to ES Tech. Rep. Archives: ICD2010-27 |
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| Conference Information | |
| Committee | ICD ITE-IST |
| Conference Date | 2010-07-22 - 2010-07-23 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Josho Gakuen Osaka Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed analog and digital, RF, and sensor interface circuitry |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2010-07-ICD-IST |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Digitally-Assisted Analog Test Technology |
| Sub Title (in English) | Analog Circuit Test Technology in Nano-CMOS Era |
| Keyword(1) | Digitally-Assisted Analog Technology |
| Keyword(2) | Digitally-Assisted Analog Test Technology |
| Keyword(3) | Design for Testability |
| Keyword(4) | Self-Calibration |
| Keyword(5) | Digital Error Correction |
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| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Haruo Kobayashi |
| 1st Author's Affiliation | Gunma University (Gunma Univ.) |
| 2nd Author's Name | Takahiro J. Yamaguchi |
| 2nd Author's Affiliation | Gunma University (Gunma Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-07-22 14:00:00 |
| Presentation Time | 50 minutes |
| Registration for | ICD |
| Paper # | ICD2010-27 |
| Volume (vol) | vol.110 |
| Number (no) | no.140 |
| Page | pp.37-42 |
| #Pages | 6 |
| Date of Issue | 2010-07-15 (ICD) |
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