Paper Abstract and Keywords |
Presentation |
2010-07-16 14:30
ESD waveform measurement with current probe and optical voltage probe Mikiya Iida (Toshiba Corp.) EMCJ2010-36 EMD2010-21 Link to ES Tech. Rep. Archives: EMD2010-21 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
ESD causes the malfunction of an electronic equipment. In order to clarify the ESD influence to malfunction mechanism, it is important to measure ESD waveform on IC input terminals. We present a novel ESD measuring method using current probe and the optical voltage probe in this paper. We carried out experimentation to estimate the validity. The transfer characteristics of the probes, waveform when the ESD was applied to target plane and waveform when the ESD was applied to microstrip line substrate were measured respectively. The waveform measured by current probe showed good agreement with that by optical voltage probe and the validation of our measuring approach is confirmed. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
ESD / Contact Discharge / IEC61000-4-2 / Microstrip Line / Current Probe / Optical Voltage Probe / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 132, EMCJ2010-36, pp. 25-30, July 2010. |
Paper # |
EMCJ2010-36 |
Date of Issue |
2010-07-09 (EMCJ, EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMCJ2010-36 EMD2010-21 Link to ES Tech. Rep. Archives: EMD2010-21 |
Conference Information |
Committee |
EMCJ EMD |
Conference Date |
2010-07-16 - 2010-07-16 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Electric discharge, Packaging, EMC, etc. |
Paper Information |
Registration To |
EMCJ |
Conference Code |
2010-07-EMCJ-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
ESD waveform measurement with current probe and optical voltage probe |
Sub Title (in English) |
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Keyword(1) |
ESD |
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Contact Discharge |
Keyword(3) |
IEC61000-4-2 |
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Microstrip Line |
Keyword(5) |
Current Probe |
Keyword(6) |
Optical Voltage Probe |
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1st Author's Name |
Mikiya Iida |
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Toshiba Corporation (Toshiba Corp.) |
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Speaker |
Author-1 |
Date Time |
2010-07-16 14:30:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2010-36, EMD2010-21 |
Volume (vol) |
vol.110 |
Number (no) |
no.132(EMCJ), no.133(EMD) |
Page |
pp.25-30 |
#Pages |
6 |
Date of Issue |
2010-07-09 (EMCJ, EMD) |
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