Paper Abstract and Keywords |
Presentation |
2010-07-02 10:15
Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) ED2010-86 SDM2010-87 Link to ES Tech. Rep. Archives: ED2010-86 SDM2010-87 |
Abstract |
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Reference Info. |
IEICE Tech. Rep., vol. 110, no. 109, ED2010-86, pp. 155-160, June 2010. |
Paper # |
ED2010-86 |
Date of Issue |
2010-06-23 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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ED2010-86 SDM2010-87 Link to ES Tech. Rep. Archives: ED2010-86 SDM2010-87 |
Conference Information |
Committee |
ED SDM |
Conference Date |
2010-06-30 - 2010-07-02 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tokyo Inst. of Tech. Ookayama Campus |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
2010 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices |
Paper Information |
Registration To |
ED |
Conference Code |
2010-06-ED-SDM |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
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Title (in English) |
Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients |
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1st Author's Name |
Chun-Hyung Cho |
1st Author's Affiliation |
Hongik University (Hongik Univ.) |
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Ho-Young Cha |
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Hongik University (Hongik Univ.) |
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Speaker |
Author-1 |
Date Time |
2010-07-02 10:15:00 |
Presentation Time |
15 minutes |
Registration for |
ED |
Paper # |
ED2010-86, SDM2010-87 |
Volume (vol) |
vol.110 |
Number (no) |
no.109(ED), no.110(SDM) |
Page |
pp.155-160 |
#Pages |
6 |
Date of Issue |
2010-06-23 (ED, SDM) |
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