講演抄録/キーワード |
講演名 |
2010-07-02 12:15
High Integrity Gate Insulator Films on Atomically Flat Silicon Surface ○Xiang Li・Rihito Kuroda・Tomoyuki Suwa・Akinobu Teramoto・Shigetoshi Sugawa・Tadahiro Ohmi(Tohoku Univ.) ED2010-93 SDM2010-94 エレソ技報アーカイブへのリンク:ED2010-93 SDM2010-94 |
抄録 |
(和) |
A low temperature atomically flattening technology for Si(100) wafer is developed. By annealing in ultra pure argon ambient at 800 ºC, atomically flat surfaces composed of atomic terraces and steps appear uniformly in the whole 200 mm wafer without generating slip line defects. Moreover, the whole 200 mm wafer surface can be atomically flattened in shorter time by increasing the argon gas flow rate and the annealing temperature of vertical furnace. Furthermore, the MOS capacitors with the atomically flat gate oxide/Si interface formed by radical oxidation on the flattened surface show superior insulating properties such as higher Ebd and Qbd. |
(英) |
A low temperature atomically flattening technology for Si(100) wafer is developed. By annealing in ultra pure argon ambient at 800 ºC, atomically flat surfaces composed of atomic terraces and steps appear uniformly in the whole 200 mm wafer without generating slip line defects. Moreover, the whole 200 mm wafer surface can be atomically flattened in shorter time by increasing the argon gas flow rate and the annealing temperature of vertical furnace. Furthermore, the MOS capacitors with the atomically flat gate oxide/Si interface formed by radical oxidation on the flattened surface show superior insulating properties such as higher Ebd and Qbd. |
キーワード |
(和) |
/ / / / / / / |
(英) |
silicon surface / atomically flattening / MOS / radical oxidation / SiO2/Si interface / / / |
文献情報 |
信学技報, vol. 110, no. 110, SDM2010-94, pp. 183-188, 2010年6月. |
資料番号 |
SDM2010-94 |
発行日 |
2010-06-23 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
ED2010-93 SDM2010-94 エレソ技報アーカイブへのリンク:ED2010-93 SDM2010-94 |