講演抄録/キーワード |
講演名 |
2010-07-02 16:15
Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor ○Masakazu Muraguchi(Tohoku Univ.)・Yoko Sakurai・Yukihiro Takada・Shintaro Nomura・Kenji Shiraishi(Univ. of Tsukuba.)・Mitsuhisa Ikeda・Katsunori Makihara・Seiichi Miyazaki(Hiroshima Univ.)・Yasuteru Shigeta(Univ. of Hyogo)・Tetsuo Endoh(Tohoku Univ.) ED2010-122 SDM2010-123 エレソ技報アーカイブへのリンク:ED2010-122 SDM2010-123 |
抄録 |
(和) |
The efficiency and stability of electron injection from the electrode to the nano-structure is one of the most important issues for the future nano-electronic devices. In order to reveal the electron injection process to the nano-structure, we have investigated the transient current characteristics of Si-nano dot floating-gate memory. We have reported a collective motion of electrons between the two-dimensional electron gas and the nano-dot based on the measurement of the Si Nano-Dot floating gate Memory. In this study, by extending our conventional tunneling model, we propose the collective tunneling model, which supports the collective motion of electrons, and this insight is useful for designing future nano-electronic devices. |
(英) |
The efficiency and stability of electron injection from the electrode to the nano-structure is one of the most important issues for the future nano-electronic devices. In order to reveal the electron injection process to the nano-structure, we have investigated the transient current characteristics of Si-nano dot floating-gate memory. We have reported a collective motion of electrons between the two-dimensional electron gas and the nano-dot based on the measurement of the Si Nano-Dot floating gate Memory. In this study, by extending our conventional tunneling model, we propose the collective tunneling model, which supports the collective motion of electrons, and this insight is useful for designing future nano-electronic devices. |
キーワード |
(和) |
Electron Dynamics / Collective Motion of Electron / Si-Nano Dots / Quantum Dot / 2DEG / Nano-Electronics / Tunneling / Si-Nano Dots Floating Gate MOS Capacitor |
(英) |
Electron Dynamics / Collective Motion of Electron / Si-Nano Dots / Quantum Dot / 2DEG / Nano-Electronics / Tunneling / Si-Nano Dots Floating Gate MOS Capacitor |
文献情報 |
信学技報, vol. 110, no. 110, SDM2010-123, pp. 319-324, 2010年6月. |
資料番号 |
SDM2010-123 |
発行日 |
2010-06-23 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
ED2010-122 SDM2010-123 エレソ技報アーカイブへのリンク:ED2010-122 SDM2010-123 |