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| Presentation | 2010-05-14 11:00 Study on the complex permittivity measurements for underfill materials using the cutoff waveguide method Takashi Shimizu, Masato Nakamura, Yoshinori Kogami (Utsunomiya Univ.)  MW2010-23 Link to ES Tech. Rep. Archives: MW2010-23 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The cutoff waveguide method is well known as a measurement method for low loss dielectric materials in millimeter wave region. Authors have reported that this method was able to measure in high accuracy the dielectric material which has the value of the loss tangent of 10-3 or less. However, the study on the measurement of the dielectric materials which has the value of loss tangent of 10-2 order was insufficient. In this paper, the study on the complex permittivity measurements for mid loss dielectric materials using the cutoff waveguide method is presented. Underfill materials, which used for packaging of semiconductor circuits, is selected as mid loss dielectric materials. As a result, the measurement accuracy of the cutoff waveguide method for the dielectric materials with the loss tangent of 10-2 or more is within 2.3% for the relative permittivity, and is within 40% for the loss tangent. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Cutoff waveguide method / Complex permittivity / Underfill material / Millimeter-wave / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 25, MW2010-23, pp. 51-54, May 2010. | |
| Paper # | MW2010-23 | |
| Date of Issue | 2010-05-06 (MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2010-23 Link to ES Tech. Rep. Archives: MW2010-23 |
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| Conference Information | |
| Committee | MW |
| Conference Date | 2010-05-13 - 2010-05-14 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | University of Hyogo |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Technologies |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2010-05-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on the complex permittivity measurements for underfill materials using the cutoff waveguide method |
| Sub Title (in English) | |
| Keyword(1) | Cutoff waveguide method |
| Keyword(2) | Complex permittivity |
| Keyword(3) | Underfill material |
| Keyword(4) | Millimeter-wave |
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| 1st Author's Name | Takashi Shimizu |
| 1st Author's Affiliation | Utsunomiya University (Utsunomiya Univ.) |
| 2nd Author's Name | Masato Nakamura |
| 2nd Author's Affiliation | Utsunomiya University (Utsunomiya Univ.) |
| 3rd Author's Name | Yoshinori Kogami |
| 3rd Author's Affiliation | Utsunomiya University (Utsunomiya Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-05-14 11:00:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | MW2010-23 |
| Volume (vol) | vol.110 |
| Number (no) | no.25 |
| Page | pp.51-54 |
| #Pages | 4 |
| Date of Issue | 2010-05-06 (MW) |
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