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| Presentation | 2010-05-13 16:20 A Case Study of Evaluation Technique for Soft Error Tolerance on SRAMs-based FPGAs. Tsuyoshi Kimura, Noritaka Kai, Yoshiaki Tsutsumi, Motoki Amagasaki, Morihiro Kuga, Toshinori Sueyoshi (Kumamoto Univ.)  RECONF2010-7 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | SRAM-based field programmable gate arrays (FPGAs) are vulnerable to a single event upset (SEU),which is induced by radiation effect. Therefore, the importance of the dependable implementation technique is increasing, and the accurate dependability analysis method is required in order to demonstrate their dependability. Most of present analysis technique is performed by using dynamic partial reconfiguration to emulate the soft-error. However, it takes long time to analyze the dependability because it requires many times of reconfiguration to complete the soft-error injection. In the present paper, we construct the soft-error estimation system to analyze the reliability and to reduce the estimation time. As a result of our experimentation for 16 bits full-adder and multiplier, we can estimate the dependability of implemented system. Moreover, the constructed system can reduce the estimation time. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | soft error / partial reconfiguration / SEU / self test / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 32, RECONF2010-7, pp. 37-42, May 2010. | |
| Paper # | RECONF2010-7 | |
| Date of Issue | 2010-05-06 (RECONF) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | RECONF2010-7 |
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| Conference Information | |
| Committee | RECONF |
| Conference Date | 2010-05-13 - 2010-05-14 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | RECONF |
| Conference Code | 2010-05-RECONF |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Case Study of Evaluation Technique for Soft Error Tolerance on SRAMs-based FPGAs. |
| Sub Title (in English) | |
| Keyword(1) | soft error |
| Keyword(2) | partial reconfiguration |
| Keyword(3) | SEU |
| Keyword(4) | self test |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Tsuyoshi Kimura |
| 1st Author's Affiliation | Kumamoto University (Kumamoto Univ.) |
| 2nd Author's Name | Noritaka Kai |
| 2nd Author's Affiliation | Kumamoto University (Kumamoto Univ.) |
| 3rd Author's Name | Yoshiaki Tsutsumi |
| 3rd Author's Affiliation | Kumamoto University (Kumamoto Univ.) |
| 4th Author's Name | Motoki Amagasaki |
| 4th Author's Affiliation | Kumamoto University (Kumamoto Univ.) |
| 5th Author's Name | Morihiro Kuga |
| 5th Author's Affiliation | Kumamoto University (Kumamoto Univ.) |
| 6th Author's Name | Toshinori Sueyoshi |
| 6th Author's Affiliation | Kumamoto University (Kumamoto Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-05-13 16:20:00 |
| Presentation Time | 25 minutes |
| Registration for | RECONF |
| Paper # | RECONF2010-7 |
| Volume (vol) | vol.110 |
| Number (no) | no.32 |
| Page | pp.37-42 |
| #Pages | 6 |
| Date of Issue | 2010-05-06 (RECONF) |
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