Paper Abstract and Keywords |
Presentation |
2010-03-05 16:05
Influence of Paraffin on Contact Resistance of Sn and Au Contacts Keisuke Taniguchi, Masaru Takeshita, Kazuo Iida, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2009-138 Link to ES Tech. Rep. Archives: EMD2009-138 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The decrease of force for insertion of the automotive connector is attempted along with advancement of the miniaturization and the multipolarization of the automotive connector. The contact oil is effect on the decrease, and has an effect on fretting corrosion. In this study, the influence of the paraffin on the contact resistance in static contact was examined. As a result, the influence of the paraffin was not recognized for the contact resistance by the load of 0.01N or more, and it was guessed that the paraffin in contact part is very thin for the tunnel conduction to occur easily or exclusion from the contact part. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Paraffin / Contact Resistance / Sn Plating / Au Plating / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 452, EMD2009-138, pp. 45-48, March 2010. |
Paper # |
EMD2009-138 |
Date of Issue |
2010-02-26 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2009-138 Link to ES Tech. Rep. Archives: EMD2009-138 |
Conference Information |
Committee |
EMD |
Conference Date |
2010-03-05 - 2010-03-05 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Yokohama National University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Short note (Graduation thesis and master's thesis) |
Paper Information |
Registration To |
EMD |
Conference Code |
2010-03-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Influence of Paraffin on Contact Resistance of Sn and Au Contacts |
Sub Title (in English) |
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Keyword(1) |
Paraffin |
Keyword(2) |
Contact Resistance |
Keyword(3) |
Sn Plating |
Keyword(4) |
Au Plating |
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1st Author's Name |
Keisuke Taniguchi |
1st Author's Affiliation |
Mie University (Mie Univ.) |
2nd Author's Name |
Masaru Takeshita |
2nd Author's Affiliation |
Mie University (Mie Univ.) |
3rd Author's Name |
Kazuo Iida |
3rd Author's Affiliation |
Mie University (Mie Univ.) |
4th Author's Name |
Yasushi Saitoh |
4th Author's Affiliation |
Mie University (Mie Univ.) |
5th Author's Name |
Yasuhiro Hattori |
5th Author's Affiliation |
AutoNetworks Technologies, Ltd. (AutoNetworks Technologies, Ltd.) |
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Speaker |
Author-1 |
Date Time |
2010-03-05 16:05:00 |
Presentation Time |
15 minutes |
Registration for |
EMD |
Paper # |
EMD2009-138 |
Volume (vol) |
vol.109 |
Number (no) |
no.452 |
Page |
pp.45-48 |
#Pages |
4 |
Date of Issue |
2010-02-26 (EMD) |
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