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Paper Abstract and Keywords
Presentation 2010-02-19 15:45
Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance
Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124 Link to ES Tech. Rep. Archives: EMD2009-124
Abstract (in Japanese) (See Japanese page) 
(in English) Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere. As the surface covered with the film, surfcae corrosion is prevented from gas in the atmosphere, the surface has corrosion resistance characteristic. However, the oxide film is interposed between contact interfaces, contact resistance increase extremely in low contact load. therefore, the problem of contact reliability is exist. In previous study, the growth law of tin oxide film was already clarified. namely, the oxide film thickness saturated about 10nm at room temperature. At elevated temperature (80-120 centigrade degree), thr growth law indicated same tendency as at low temperature. In this study, growth law at the temperature of 150 degree was studied, and it was found that the growth law was different from that of low temperature. The cause is found in change of optical constants of the surface. This should be dependence of formation of the film. The film formation is amorphous SnO at temperature between romm temperature to 80 degree. However, at 120 degree, the formation changed to crystallized SnO2. Moreover, for 150 degree, the crystallization is much more remarkable.
Keyword (in Japanese) (See Japanese page) 
(in English) plated tin / tin oxide film / electromechanical devices / contact resistance / electorical contatcts / EPMA / ellipsometry /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 420, EMD2009-124, pp. 43-48, Feb. 2010.
Paper # EMD2009-124 
Date of Issue 2010-02-12 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF R2009-57 EMD2009-124 Link to ES Tech. Rep. Archives: EMD2009-124

Conference Information
Committee EMD R  
Conference Date 2010-02-19 - 2010-02-19 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2010-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance 
Sub Title (in English)  
Keyword(1) plated tin  
Keyword(2) tin oxide film  
Keyword(3) electromechanical devices  
Keyword(4) contact resistance  
Keyword(5) electorical contatcts  
Keyword(6) EPMA  
Keyword(7) ellipsometry  
Keyword(8)  
1st Author's Name Yuya Nabeta  
1st Author's Affiliation Mie University (Mie Univ.)
2nd Author's Name Shigeru Sawada  
2nd Author's Affiliation Mie University (Mie Univ.)
3rd Author's Name Yasushi Saitoh  
3rd Author's Affiliation Mie University (Mie Univ.)
4th Author's Name Atsushi Shimizu  
4th Author's Affiliation AutoNetworks Technologies, Ltd. (AutoNet Tech.)
5th Author's Name Yasuhiro Hattori  
5th Author's Affiliation AutoNetworks Technologies, Ltd. (AutoNet Tech.)
6th Author's Name Terutaka Tamai  
6th Author's Affiliation Mie University (Mie Univ.)
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Speaker Author-1 
Date Time 2010-02-19 15:45:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2009-57, EMD2009-124 
Volume (vol) vol.109 
Number (no) no.419(R), no.420(EMD) 
Page pp.43-48 
#Pages
Date of Issue 2010-02-12 (R, EMD) 


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