Paper Abstract and Keywords |
Presentation |
2010-02-19 16:35
Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd) R2009-59 EMD2009-126 Link to ES Tech. Rep. Archives: EMD2009-126 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Sn is a material often used as a plating material of electric contact, but the oxide layer is formed by exposure to air. The oxide layer is easily destroyed by mechanical contact due to softness of Sn, and it is difficult to measure the electrical properties of the oxide layer. The electrical property is measured avoiding mechanical destruction of the oxide layer because the liquid metal is used as an electrode in this research. As a result, Sn oxide layer was destroyed by mechanical contact but it was able to measure the electrical property without damaging the Sn oxide layer using the liquid metal as an electrode. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Sn Plating / Oxide Layer / Liquid Metal / Galinstan / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 420, EMD2009-126, pp. 53-57, Feb. 2010. |
Paper # |
EMD2009-126 |
Date of Issue |
2010-02-12 (R, EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2009-59 EMD2009-126 Link to ES Tech. Rep. Archives: EMD2009-126 |
Conference Information |
Committee |
EMD R |
Conference Date |
2010-02-19 - 2010-02-19 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2010-02-EMD-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal |
Sub Title (in English) |
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Keyword(1) |
Sn Plating |
Keyword(2) |
Oxide Layer |
Keyword(3) |
Liquid Metal |
Keyword(4) |
Galinstan |
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1st Author's Name |
Tomoki Yonekawa |
1st Author's Affiliation |
Mie University (Mie Univ.) |
2nd Author's Name |
Yasushi Saitoh |
2nd Author's Affiliation |
Mie University (Mie Univ.) |
3rd Author's Name |
Kazuo Iida |
3rd Author's Affiliation |
Mie University (Mie Univ.) |
4th Author's Name |
Shigeru Sawada |
4th Author's Affiliation |
Mie University (Mie Univ.) |
5th Author's Name |
Yasuhiro Hattori |
5th Author's Affiliation |
AutoNetworks Technologies Ltd (AutoNetworks Tech. Ltd) |
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Speaker |
Author-1 |
Date Time |
2010-02-19 16:35:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
R2009-59, EMD2009-126 |
Volume (vol) |
vol.109 |
Number (no) |
no.419(R), no.420(EMD) |
Page |
pp.53-57 |
#Pages |
5 |
Date of Issue |
2010-02-12 (R, EMD) |
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