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| Presentation | 2010-02-15 10:25 Modeling resistive open faults and generating their tests Hiroshi Takahashi, Yoshinobu Higami, Yuta Shudo, Yuji Takamune, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima)  DC2009-68 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In order to solve the problem of signal integrity, we propose an extended delay fault model for modeling a resistive open fault. We use the three-dimensional electromagnetic software to analyze the behavior of a line with the resistive open. Under the extended delay fault model proposed in this paper, the size of the additional delay is depended on the signal transitions at the adjacent lines that are assigned by the test-pair. Under the launch on capture (LOC) test, we propose a method for generating the test-pairs for the resistive open faults by using the transition fault tests with don't cares. We demonstrated the experimental results to show that the proposed method is able to generate the test-pair for resistive open faults that cannot be detected by the given test-pairs for the transition faults. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | resistive open fault / test pattern generation / extended delay fault model / adjacent lines / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 416, DC2009-68, pp. 19-24, Feb. 2010. | |
| Paper # | DC2009-68 | |
| Date of Issue | 2010-02-08 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2009-68 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2010-02-15 - 2010-02-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2010-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Modeling resistive open faults and generating their tests |
| Sub Title (in English) | |
| Keyword(1) | resistive open fault |
| Keyword(2) | test pattern generation |
| Keyword(3) | extended delay fault model |
| Keyword(4) | adjacent lines |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiroshi Takahashi |
| 1st Author's Affiliation | Ehime University (Ehime Univ.) |
| 2nd Author's Name | Yoshinobu Higami |
| 2nd Author's Affiliation | Ehime University (Ehime Univ.) |
| 3rd Author's Name | Yuta Shudo |
| 3rd Author's Affiliation | Ehime University (Ehime Univ.) |
| 4th Author's Name | Yuji Takamune |
| 4th Author's Affiliation | Ehime University (Ehime Univ.) |
| 5th Author's Name | Yuzo Takamatsu |
| 5th Author's Affiliation | Ehime University (Ehime Univ.) |
| 6th Author's Name | Toshiyuki Tsutsumi |
| 6th Author's Affiliation | Meiji University (Meiji Univ.) |
| 7th Author's Name | Koji Yamazaki |
| 7th Author's Affiliation | Meiji University (Meiji Univ.) |
| 8th Author's Name | Hiroyuki Yotsuyanagi |
| 8th Author's Affiliation | The University of Tokushima (Univ. of Tokushima) |
| 9th Author's Name | Masaki Hashizume |
| 9th Author's Affiliation | The University of Tokushima (Univ. of Tokushima) |
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| Speaker | Author-1 |
| Date Time | 2010-02-15 10:25:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2009-68 |
| Volume (vol) | vol.109 |
| Number (no) | no.416 |
| Page | pp.19-24 |
| #Pages | 6 |
| Date of Issue | 2010-02-08 (DC) |
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