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| Presentation | 2010-02-15 15:40 High Speed X-Fault Diagnosis with Partial X-Resolution Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.)  DC2009-76 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Defects behavior of ultra small size and high speed LSI is getting complicated. It makes localization of fault site and analysis of the cause of fault more difficult. X-fault model can represent various combinations of faulty values. Fault diagnosis with X-fault model can more accurately locate the fault site than one with conventional stuck-at fault model. However, computation time for X-fault simulation in the diagnosis becomes larger. In this paper, we propose a method to reduce computation time for X-fault simulation by pruning unnecessary simulation vectors. In the experimental results, the proposed method can reduce computation time for X-fault simulation without degradation of diagnosis results. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Fault diagnosis / Localization of fault site / X-fault model / fault simulation / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 416, DC2009-76, pp. 69-74, Feb. 2010. | |
| Paper # | DC2009-76 | |
| Date of Issue | 2010-02-08 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2009-76 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2010-02-15 - 2010-02-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2010-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | High Speed X-Fault Diagnosis with Partial X-Resolution |
| Sub Title (in English) | |
| Keyword(1) | Fault diagnosis |
| Keyword(2) | Localization of fault site |
| Keyword(3) | X-fault model |
| Keyword(4) | fault simulation |
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| 1st Author's Name | Kohei Miyase |
| 1st Author's Affiliation | Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
| 2nd Author's Name | Yusuke Nakamura |
| 2nd Author's Affiliation | Panasonic Communications Software Co.,Ltd. (Panasonic Communications Software Co.,Ltd.) |
| 3rd Author's Name | Yuta Yamato |
| 3rd Author's Affiliation | Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
| 4th Author's Name | Xiaoqing Wen |
| 4th Author's Affiliation | Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
| 5th Author's Name | Seiji Kajihara |
| 5th Author's Affiliation | Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2010-02-15 15:40:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2009-76 |
| Volume (vol) | vol.109 |
| Number (no) | no.416 |
| Page | pp.69-74 |
| #Pages | 6 |
| Date of Issue | 2010-02-08 (DC) |
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