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Paper Abstract and Keywords
Presentation 2010-01-29 10:50
High-precision Measurement of the Threshold Voltage, the Elastic Constants Ratio and the Dielectric Constants Ratio of Liquid Crystal Materials
Yusuke Chiba, Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida (Tohoku Univ.) EID2009-71 Link to ES Tech. Rep. Archives: EID2009-71
Abstract (in Japanese) (See Japanese page) 
(in English) We devised a high-precision method of measuring the threshold voltage and the elastic and dielectric constants ratios of liquid crystal materials. We obtained these parameters from measuring the alignment distribution of homogeneous alignment LC cell in the on state. We confirmed the validly of this method through measurements of several LC cells with different gaps.
Keyword (in Japanese) (See Japanese page) 
(in English) Liquid crystal / High-precision measurement / Threshold voltage / Elastic constants ratio / Dielectric constants ratio / Capacitance of alignment layer / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 404, EID2009-71, pp. 99-102, Jan. 2010.
Paper #  
Date of Issue 2010-01-21 (EID) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2009-71 Link to ES Tech. Rep. Archives: EID2009-71

Conference Information
Committee ITE-IDY EID IEIJ-SSL IEE-EDD  
Conference Date 2010-01-28 - 2010-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyusyu Univ. (Chikushi Campus) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ITE-IDY 
Conference Code 2010-01-IDY-EID-OMD-EDD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High-precision Measurement of the Threshold Voltage, the Elastic Constants Ratio and the Dielectric Constants Ratio of Liquid Crystal Materials 
Sub Title (in English)  
Keyword(1) Liquid crystal  
Keyword(2) High-precision measurement  
Keyword(3) Threshold voltage  
Keyword(4) Elastic constants ratio  
Keyword(5) Dielectric constants ratio  
Keyword(6) Capacitance of alignment layer  
Keyword(7)  
Keyword(8)  
1st Author's Name Yusuke Chiba  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yuji Ohno  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Takahiro Ishinabe  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Tetsuya Miyashita  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Tatsuo Uchida  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker
Date Time 2010-01-29 10:50:00 
Presentation Time 10 
Registration for ITE-IDY 
Paper # IEICE-EID2009-71 
Volume (vol) IEICE-109 
Number (no) no.404 
Page pp.99-102 
#Pages IEICE-4 
Date of Issue IEICE-EID-2010-01-21 


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